Chemical Mechanical Polishing Head Cooling for Pad Hardness

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Excessive heat generation during chemical mechanical polishing leads to reduced hardness and removal rate of the polishing pad, affecting the reliability of the process.

Innovation Solution

Incorporation of a cooling device with cooling pipes and thermal conductivity polymer materials in the wafer accommodating part and polishing pad to reduce friction heat.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If friction between the polishing pad and wafer occurs during polishing, then polishing function is achieved, but excessive heat is generated causing reduced pad hardness and removal rate

Engineering Contradiction:
Improvepolishing process reliabilityVSAvoidpolishing pad temperature
Core Design Contradiction:
ReliabilityVSTemperature

Solution Approach 1:

A cooling device is introduced as an intermediary component between the polishing pad and the polishing environment. The cooling device includes cooling channels that allow coolant circulation, serving as a heat transfer mediator to remove excessive heat from the polishing pad during operation, thereby preventing temperature rise that would reduce pad hardness and removal rate

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent replaces purely mechanical friction-based polishing with a hybrid approach by integrating thermal management. The cooling device substitutes for passive mechanical heat dissipation with active thermal control, using coolant flow to manage heat generation from friction between the polishing pad and wafer

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Strength

If cooling device is added to reduce friction heat, then pad hardness is maintained, but device complexity increases

Engineering Contradiction:
Improvepolishing pad hardnessVSAvoidpolishing apparatus complexity
Core Design Contradiction:
StrengthVSDevice complexity

Solution Approach 1:

The cooling device is merged with the polishing head structure, combining the cooling function with the existing mechanical assembly. The cooling channels are integrated into the polishing head body, and the cooling device works in conjunction with the wafer holder and clamping mechanism, thereby maintaining pad hardness while minimizing the increase in overall device complexity

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The cooling device is designed to serve multiple functions: it cools the polishing pad during operation, supports the wafer holder structure, and integrates with the clamping mechanism. This multi-functionality reduces the need for separate components, thereby maintaining pad hardness without proportionally increasing device complexity

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Improves the reliability of the chemical mechanical polishing process by effectively managing heat, maintaining pad hardness, and ensuring accurate polishing.

Implementation Method 1

a cooling device including a cooling pipe on an exterior surface of the wafer accommodating part

Methodology Applied
Scientific EffectThermal conduction: Conduction (thermal)

Implementation Method 2

at least some of the body part and the plurality of protruding portions include a thermal conductivity polymer material

Methodology Applied
Scientific EffectThermal conduction: Conduction (thermal)

Data Source

PatentUS20250296198A1Chemical mechanical polishing apparatus
Publication Date: 2025.09.25 SAMSUNG ELECTRONICS CO LTD
  • US20250296198A1 patent drawing
  • US20250296198A1 patent drawing
  • US20250296198A1 patent drawing

AI summary

Provided is a chemical mechanical polishing apparatus including a polishing platen, a polishing pad on a first surface of the polishing platen, a polishing head on the polishing pad, the polishing head being configured to fix the wafer, a wafer accommodating part protruded from a first surface of the polishing head facing the first surface of the polishing pad, the wafer accommodating part having a ring shape along an edge of the first surface of the polishing head, and a cooling device including a cooling pipe on an exterior surface of the wafer accommodating part.