Poly-Silicon Current Limiting Resistor for Bootstrap Diode

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Conventional bootstrap circuits in semiconductor devices experience inaccuracies in resistance value due to uneven current paths and localized heat generation in the current limiting resistor, leading to fluctuations in resistance accuracy.

Innovation Solution

The current limiting resistor is configured with multiple poly-silicon layers connected in parallel, forming uniform current paths and increasing the surface area for improved heat dissipation, with the poly-silicon layers arranged in a spiral or ring shape around a central connector to distribute current uniformly.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If a single poly-silicon layer is used as the current limiting resistor, then the device complexity is reduced and manufacturing is simpler, but the resistance value accuracy deteriorates due to uneven current paths and localized heat generation

Engineering Contradiction:
Improveresistance value accuracyVSAvoidresistor structure complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The current limiting resistor is divided into multiple poly-silicon layers (first, second, and third layers) with different resistance values. Each layer has a distinct resistance value (R1, R2, R3) that contributes to the total resistance. This segmentation allows for more precise control of the overall resistance value and distributes current flow across multiple paths, reducing localized heat generation and improving resistance accuracy.

Inventive Principle:
Principle #1Segmentation

2Ease of manufacture

If a rectangular poly-silicon layer is used, then the sheet resistance calculation is simple and design is easier, but the current path uniformity deteriorates leading to localized heat concentration

Engineering Contradiction:
Improvedesign simplicityVSAvoidheat distribution uniformity
Core Design Contradiction:
Ease of manufactureVSTemperature

Solution Approach 1:

Each poly-silicon layer is designed with specific local characteristics - different resistance values and different positional arrangements (first layer at center, second layer offset toward anode, third layer offset toward cathode). This local quality variation ensures that current is distributed more uniformly across the resistor structure, preventing concentration in any single region and improving heat distribution while maintaining manufacturing feasibility.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration suppresses local heat generation and resistance value fluctuations, enhancing the accuracy and reliability of the current limiting resistor in semiconductor devices.

Implementation Method 1

The current limiting resistor is configured with multiple poly-silicon layers connected in parallel, forming uniform current paths and increasing the surface area for improved heat dissipation

Methodology Applied
Scientific EffectElectrical conduction: Conduction (electrical)

Implementation Method 2

increasing the surface area for improved heat dissipation, with the poly-silicon layers arranged in a spiral or ring shape around a central connector to distribute current uniformly

Methodology Applied
Scientific EffectThermal conduction: Conduction (thermal)

Data Source

PatentUS10673425B2Semiconductor device
Publication Date: 2020.06.02 FUJI ELECTRIC CO LTD
  • US10673425B2 patent drawing
  • US10673425B2 patent drawing
  • US10673425B2 patent drawing

AI summary

A current limiting resistor opposes a p-type anode region of a bootstrap diode in a depth direction, across an insulating film. The current limiting resistor is configured by poly-silicon layers constituting poly-silicon resistors, and a poly-silicon connector that is a connector connected to a limiting resistor electrode. The poly-silicon layers are disposed further outside than is the poly-silicon connector and each has a first end connected to the poly-silicon connector. The poly-silicon layers each have a second end and a part that is toward the second end and that is in contact with an anode electrode via a contact hole. Further, the poly-silicon layers are disposed evenly between a part thereof connected to the poly-silicon connector and the contact hole.