Polypyridine Leveling Agent for Flat, Defect-Free Copper Electroplating
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Solution Overview
Problem
In the electroplating process for copper in electronic manufacturing, uneven copper deposition leads to defects such as voids and seams, resulting in non-flat copper layers that complicate subsequent chemical mechanical polishing (CMP) processes, especially in high-density and low-density interconnection pattern regions.
Innovation Solution
A polypyridine-based leveling agent is used in the electroplating composition to inhibit excessive copper deposition, ensuring defect-free filling of small-sized holes or grooves and reducing thickness differences between high-density and low-density regions, thereby improving surface flatness and facilitating CMP.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional electroplating additives are used to achieve defect-free filling, then voids and seams are eliminated, but copper continues to deposit excessively on the pattern top, resulting in non-flat copper layers with bump defects
Solution Approach 1:
The patent modifies the molecular structure of the leveling agent by introducing specific functional groups (carboxyl, hydroxyl, or amine groups) at defined positions relative to the aromatic ring. This structural parameter change enables the additive to simultaneously achieve defect-free filling and control surface flatness by regulating copper deposition behavior through its specific chemical structure and functional group configuration.
Solution Approach 2:
The patent creates a composite functional additive that combines the characteristics of both filling promoter and leveling agent in a single molecular structure. The additive integrates an aromatic core with specific functional groups that work synergistically to prevent voids and seams while simultaneously controlling excessive deposition on pattern tops, thus resolving the contradiction between reliability and surface flatness.
2Productivity
If copper deposition is accelerated to improve filling efficiency, then productivity increases, but thickness difference between high-density and low-density regions increases, complicating subsequent CMP processes
Solution Approach 1:
The patent employs an additive with specific local functional groups positioned at defined distances from the aromatic ring center. These functional groups provide localized interaction with copper ions and electrode surfaces, enabling different regions (high-density vs. low-density) to receive differentiated deposition control. This local quality approach allows accelerated filling while maintaining thickness uniformity across varying pattern densities.
Solution Approach 2:
The functional groups in the additive (carboxyl, hydroxyl, or amine groups) act as feedback mechanisms that sense and respond to local deposition conditions. These groups dynamically adjust copper deposition rates based on the local environment, providing negative feedback that prevents excessive thickness buildup in high-density regions while ensuring adequate filling in low-density areas, thus maintaining productivity without sacrificing uniformity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The polypyridine compound achieves defect-free, high-flatness copper deposition, simplifying CMP processes and enhancing the reliability of electronic products by ensuring even copper layer thickness across varying density regions.
Implementation Method 1
Filling electroplating copper in holes or grooves such as grooves, plated through holes, or blind via holes of different sizes is completed through an electroplating process
Implementation Method 2
an appropriate additive is generally added to an electroplating solution, to change a polarization potential of an electrode surface
Data Source
AI summary
An embodiment of the present disclosure provides a leveling agent, which is specifically a polypyridine compound, where the polypyridine compound includes a structural unit shown in Formula (I) or a protonated product of the structural unit shown in Formula (I):In Formula (I), R1 and R2 are independently any one of the following: substituted or unsubstituted alkylene, substituted or unsubstituted arylene, substituted or unsubstituted arylene alkyl, substituted or unsubstituted alkylene aryl, alkylene containing an ether oxygen atom, ester, and/or imide, arylene containing an ether oxygen atom, ester, and/or imide, arylene alkyl containing an ether oxygen atom, ester, and/or imide, and alkylene aryl containing an ether oxygen atom, ester, and/or imide; and R3 is any one of groups such as a single bond, substituted or unsubstituted alkylene, substituted or unsubstituted arylene, substituted or unsubstituted arylene alkyl, and substituted or unsubstituted alkylene aryl.


