Porous Semiconductor Isolation Structure for Low Off-Capacitance FETs

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Solution Overview

Problem

Conventional field-effect transistors exhibit high off-capacitance, which negatively impacts device performance in semiconductor device structures, particularly in CMOS processes used for radio-frequency integrated circuits.

Innovation Solution

A semiconductor device structure is formed using a porous semiconductor material as a substrate with a single-crystal semiconductor layer in cavities, where the porous material serves as a crystalline template for epitaxial growth of doped single-crystal layers, reducing off-capacitance by creating a shallow trench isolation region and utilizing epitaxial growth to form doped regions within these layers.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional field-effect transistor structures are used, then device fabrication is straightforward, but off-capacitance is high which deteriorates device performance

Engineering Contradiction:
Improvedevice performanceVSAvoidoff-capacitance
Core Design Contradiction:
ReliabilityVSObject-generated harmful factors

Solution Approach 1:

The semiconductor structure is segmented into multiple layers: a porous semiconductor substrate layer and a separate single-crystal semiconductor layer formed in cavities within the porous layer. This segmentation allows the porous substrate to provide mechanical support while the single-crystal layer provides high-quality electrical characteristics, thereby reducing off-capacitance and improving device performance without complicating the overall fabrication process

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different regions of the semiconductor structure are assigned different material qualities: the porous semiconductor substrate provides mechanical stability and ease of fabrication, while localized single-crystal semiconductor regions embedded in cavities provide low off-capacitance. This local quality differentiation allows each region to optimize its function, reducing harmful off-capacitance effects while maintaining fabrication simplicity

Inventive Principle:
Principle #3Local quality

2Object-generated harmful factors

If porous semiconductor material is used as substrate, then off-capacitance is reduced, but manufacturing complexity increases

Engineering Contradiction:
Improveoff-capacitanceVSAvoidfabrication process
Core Design Contradiction:
Object-generated harmful factorsVSEase of manufacture

Solution Approach 1:

The porous semiconductor substrate is prepared in advance with a regular array of cavities formed before the single-crystal semiconductor layers are deposited. This preliminary structuring of the substrate allows subsequent epitaxial growth to proceed efficiently in pre-defined locations, reducing manufacturing complexity while maintaining the off-capacitance reduction benefits of the porous structure

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The porous semiconductor substrate acts as an intermediary between the substrate preparation process and the final device formation. It provides a pre-fabricated template with cavities that guides the formation of single-crystal layers, simplifying the overall manufacturing process while enabling the off-capacitance reduction achieved by the porous structure

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution effectively reduces off-capacitance in field-effect transistors, enhancing performance metrics and improving the overall efficiency of semiconductor device structures.

Implementation Method 1

the porous material serves as a crystalline template for epitaxial growth of doped single-crystal layers

Methodology Applied
Scientific EffectEpitaxial growth: Epitaxy

Data Source

PatentUS20240088157A1Semiconductor device structures isolated by porous semiconductor material
Publication Date: 2024.03.14 GLOBALFOUNDRIES US INC
  • US20240088157A1 patent drawing
  • US20240088157A1 patent drawing
  • US20240088157A1 patent drawing

AI summary

Semiconductor device structures with device isolation and methods of forming a semiconductor device structure with device isolation. The structure comprises a semiconductor substrate, a first semiconductor layer on the semiconductor substrate, a second semiconductor layer in a cavity in the first semiconductor layer, and a device structure including a doped region in the second semiconductor layer. The first semiconductor layer comprises a porous semiconductor material, and the second semiconductor layer comprises a single-crystal semiconductor material.