Power-On Reset Circuit Inspection Using Triggered Release Detection
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Solution Overview
Problem
Conventional inspection devices face challenges in accurately determining the normal functioning of power-on reset circuits due to the slow rise time of reset signals, which is exacerbated by the variability of RC circuits and short rise times of DC voltage, making it difficult to specify when the reset release signal is outputted, especially when the rise time of the DC voltage is short.
Innovation Solution
An inspection device and method that utilize a trigger output section to generate a trigger signal after the DC voltage has risen, allowing a signal output section to transition from an initialization level to a release level, enabling the determination section to assess the circuit's functionality regardless of the start-up period of the DC voltage, thereby ensuring accurate inspection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If the DC voltage rise time is shortened to improve productivity, then inspection duration is reduced, but the reset signal rise time becomes too slow to accurately determine the reset release point
Solution Approach 1:
The patent introduces a level transition detection circuit as an intermediary between the PoR circuit output and the determination section. This circuit generates a level transition signal that clearly indicates when the reset signal transitions from low to high level, enabling precise measurement even when the reset signal itself has a slow rise time. The intermediary circuit effectively decouples the measurement precision from the signal rise time constraint.
2Stability of the object's composition
If the PoR circuit reset signal rise time is increased to ensure stable logic circuit initialization, then the reset release point becomes harder to specify, but faster reset release is needed for shorter DC voltage rise times
Solution Approach 1:
The patent employs dynamic detection by monitoring the level transition of the reset signal rather than relying on fixed time thresholds. The level transition signal is generated dynamically when the reset signal crosses from low to high level, allowing the system to adapt to varying reset signal characteristics while maintaining accurate detection of the reset release point.
3Measurement precision
If step-wise voltage increases are used to ensure accurate inspection, then inspection complexity increases, but simplified inspection procedures are needed
Solution Approach 1:
The patent extracts the level transition detection function from the complex step-wise voltage increase procedure and implements it as a dedicated circuit component. By taking out this critical detection function and hardwiring it into the inspection device, the system achieves high measurement precision through a simplified, single-step inspection procedure without requiring multiple voltage stages.
Data Source
AI summary
The present invention provides semiconductor integrated circuit, inspection device and inspection method for inspecting whether inspection target is functioning normally regardless to start-up period of a power supply voltage. The inspection device includes a reset control circuit and a tester. When a reset signal is inputted from a power-on reset circuit to a first terminal, the reset control circuit starts output of a reset execution signal having the same level as the reset signal. When a trigger signal is inputted from a control device to the second input terminal, the reset control circuit finishes the output of the reset execution signal and starts output of a release execution signal that has the same level as a reset release signal from the output terminal. The tester determines whether the power-on reset circuit is functioning normally by determining whether signals outputted from the reset control circuit are at predetermined levels.