Probe Board Assembling Method for IC Testing
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Solution Overview
Problem
Existing electrical connecting apparatuses require frequent and skill-intensive planarity adjustments of probe tips to ensure reliable contact with integrated circuit terminals, and reducing process tolerances to minimize tip variation increases manufacturing costs.
Innovation Solution
An assembling method that measures the actual dimensions of the support member, probe board, and spacers to select optimal spacers that cancel out errors, allowing for precise alignment of probe tips without increasing process tolerances, thereby reducing tip variation without the need for frequent adjustments.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If conventional planarity adjustment work is performed after probe board attachment, then probe tip alignment can be achieved, but the adjustment process becomes troublesome and requires skilled operators
Solution Approach 1:
The probe board is pre-bent during manufacturing to the desired curved shape before attachment to the support member. This preliminary action ensures that when the probe board is attached using the spacer method, the probes automatically align on the same plane without requiring post-attachment adjustment work, thus resolving the contradiction between achieving alignment and avoiding complex adjustment operations
Solution Approach 2:
The adjustment operation is completely removed from the assembly process. By extracting the need for post-attachment adjustment through pre-bending and the spacer mechanism, the troublesome adjustment step is eliminated entirely, allowing unskilled operators to perform the assembly without special training
2Productivity
If the number of probes is increased to test numerous integrated circuits, then testing capability is improved, but adjustment work becomes significantly more difficult
Solution Approach 1:
The probe board is pre-bent to the correct curvature during manufacturing, so that when attached to the support member with the spacer, all probes automatically align on the same plane. This eliminates the need for individual or collective adjustment of numerous probes, making it feasible to handle large numbers of probes without proportionally increasing adjustment complexity
Solution Approach 2:
The spacer mechanism provides a universal solution that simultaneously aligns all probes on the probe board. Instead of requiring separate adjustment operations for each probe or group of probes, the spacer structure universally ensures proper alignment of the entire probe array, enabling efficient testing of numerous integrated circuits
3Manufacturing precision
If process tolerances are reduced to minimize tip variation, then alignment precision is improved, but manufacturing costs increase
Solution Approach 1:
The invention changes the approach from controlling dimensional parameters (reducing tolerances) to controlling geometric parameters (pre-bending the probe board to a specific curvature). By changing the parameter being controlled from linear dimensions to curved shape, the system achieves precise tip alignment without requiring tight process tolerances on individual component dimensions, thus avoiding increased manufacturing costs
Solution Approach 2:
The probe board is pre-bent to the desired curvature before attachment, which compensates for the cumulative effect of normal process tolerances in the support member, spacer, and probe board. This preliminary geometric adjustment ensures that despite normal manufacturing variations, the probe tips still align properly, eliminating the need for tighter tolerances and associated cost increases
Data Source
AI summary
A method for assembling an electrical connecting apparatus having a support member, a probe board, and spacers arranged between the support member and the probe board. A height of at least either each abutting part of the support member or each abutting part of the probe board facing the abutting part is measured, and a length of each of the plurality of spacers is measured. Based on measurement values obtained by these measurements, a spacer appropriate for maintaining tips of numerous probes provided on the probe board on the same plane is selected for each pair of the both abutting parts.