Test Probe Card Detection via Linear Scanning Lens and CCD
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Solution Overview
Problem
Conventional test probe card detection methods are tedious, prone to errors, and inefficient, as they require manual movement and adjustment of the probe card across multiple devices, leading to low precision and inability to detect surface oxidation, wear, or broken pins.
Innovation Solution
A test probe card detection system utilizing an x-y axis movement platform with a linear scanning lens module and CCD microscope module, which scans and adjusts the probe card automatically, comparing data with a coordinate file to detect defected pins, including oxidation, wear, and breaking, using a computer-controlled system for precise adjustment.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If manual movement and adjustment of the probe card across multiple devices is used, then the detection process can be performed, but the operation becomes tedious and time-consuming with low precision
Solution Approach 1:
The patent combines the detection device and adjustment device into a single integrated system. The probe card remains on the platform while multiple detection units with different magnifications (microscope, magnifying glass, naked eye observation) are brought to the probe card, eliminating the need for manual movement between separate devices and reducing detection time to about 2 minutes.
Solution Approach 2:
The patent replaces manual mechanical operations with an automated optical system. A linear scanning lens module with CCD camera automatically scans and captures images of the probe card pins, substituting manual observation and measurement with automated optical-mechanical scanning, which significantly reduces detection time and eliminates human error.
2Reliability
If sequential area-by-area detection is performed, then all pins can be detected, but the operation becomes very tedious and omission is possible
Solution Approach 1:
The linear scanning lens module continuously scans across the entire probe card surface in one continuous motion, capturing images of all pins without interruption. This continuous scanning action ensures complete coverage of all pins while simplifying the detection process, eliminating the need for manual area-by-area navigation and reducing the risk of omission.
3Measurement precision
If four points positioning is implemented for area comparison, then positioning can be achieved, but movement error accumulates and all pins have error
Solution Approach 1:
The patent uses a coordinate file that stores the precise theoretical positions of all pins as a reference copy. The detected pin positions are automatically compared with this coordinate file to identify deviations, eliminating the need for cumulative four-point positioning and preventing error propagation across measurements.
4Illumination intensity
If annular light emission is used in measurement, then illumination is provided, but surfaces of defected pin are shaded and defects cannot be detected
Solution Approach 1:
The patent employs multiple light sources positioned at different locations and angles around the probe card. This provides localized illumination from multiple directions, ensuring that defects such as oxidation, wear, or breaking on pin surfaces are not shaded and can be detected from various angles, improving defect detection precision while maintaining adequate illumination.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system significantly reduces detection time to about 2 minutes, enhances precision, and can detect a wider range of pin defects automatically, eliminating manual errors and increasing reliability.
Implementation Method 1
a linear scanning lens module configured to move along z-axis in a three dimensional Cartesian coordinate system, and the linear scanning lens module configured to obtain image data of all area of the test probe card to be tested by scanning
Implementation Method 2
the CCD microscope module adjusts an optimum scanning optical focal length of the linear scanning lens module with respect to the test probe card to be tested
Implementation Method 3
an operation module to compare the all areas data with coordinate data in order to detect defected pins of the test probe card to be tested
Data Source
AI summary
A test probe card detection system includes a linear scanning lens module, a CCD microscope module, a CCD image adjustment module, and a computer. The CCD microscope module adjusts and confirms a scanning optical focal length of a test probe card to be tested. The linear scanning lens module scans all areas data of the test probe card and stores the scanned all areas data in a database. The all areas data is compared with a coordinate file in order to detect defected pins of the test probe card. The CCD microscope module confirms and obtains data of the detected defected pins of the test probe card. The data of the detected defected pins is sent to the CCD image adjustment module and are shown on the computer. The defected pins include pins having surface oxidation, wear, damage, and breaking; lacking of pins; and deflected pins.