Scanning Probe Microscope Dual-Carrier Exchange Mechanism
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Solution Overview
Problem
Existing scanning probe microscope systems lack an efficient mechanism for exchanging probes and samples, requiring manual intervention and limiting the ability to quickly switch between different probes or samples for data collection.
Innovation Solution
A scanning probe microscope system with a dual-carrier exchange mechanism, where a probe carrier and a sample carrier are integrated on a transport structure, allowing for simultaneous exchange of probes and samples using various gripping methods such as friction, vacuum, electrostatic, or magnetic attraction, facilitated by a SCARA robot arm with articulated links.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If manual probe and sample exchange is used, then the system structure can be simple, but the productivity and measurement efficiency are reduced due to time-consuming manual intervention
Solution Approach 1:
The patent combines the probe carrier and sample carrier into a single integrated exchange mechanism that can simultaneously hold and transport both probe and sample. This merging of functions allows automated exchange without requiring separate manual operations, thereby improving productivity while keeping the overall structure manageable through functional integration.
Solution Approach 2:
The exchange mechanism is designed with universal carriers that can adapt to different probe and sample types. The probe carrier and sample carrier can accommodate various configurations (probes of different sizes, samples of different formats) through adjustable gripping mechanisms, enabling a single device to perform multiple exchange functions without requiring specialized mechanisms for each case.
2Speed
If a single transport structure carries both probe carrier and sample carrier, then the exchange process is simplified and speeded up, but the precision of probe and sample positioning may be compromised
Solution Approach 1:
The transport structure is segmented into distinct probe carrier and sample carrier components, each with its own positioning and gripping mechanisms. This segmentation allows the single transport structure to independently control the positioning of probe and sample, maintaining precision while enabling simultaneous transport and exchange operations that improve speed.
Solution Approach 2:
The patent introduces intermediate carriers (probe carrier and sample carrier) that act as mediators between the single transport structure and the final probe/sample positions. These carriers provide precise positioning interfaces and gripping mechanisms that ensure accurate placement even when transported together, thus maintaining manufacturing precision while enabling rapid exchange.
3Adaptability or versatility
If the probe carrier and sample carrier use different holding methods, then the adaptability to different probe and sample types is improved, but the device complexity increases
Solution Approach 1:
The probe carrier and sample carrier are designed with locally optimized holding mechanisms tailored to their specific requirements. The probe carrier may use magnetic or electrostatic fields appropriate for probe materials, while the sample carrier uses mechanical gripping or vacuum suitable for sample types. This local customization of holding methods enhances adaptability to different probe and sample types without requiring the entire system to be overly complex.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables rapid and automated exchange of probes and samples, enhancing the system's versatility and efficiency in data collection by allowing for seamless transitions between different probes and samples without interrupting the measurement process.
Implementation Method 1
the probe carrier may comprise a magnetic coil or permanent magnet which is adapted to grip the probe with a magnetic field
Implementation Method 2
the sample carrier may apply a vacuum to hold the sample
Implementation Method 3
the probe carrier and the sample carrier are adapted to carry the probe and sample by different first and second methods respectively, using a variety of methods including (but not limited to) friction
Implementation Method 4
the sample carrier is adapted to carry the sample using a second method selected from friction, vacuum, mechanical gripping, electrostatic attraction, and magnetic attraction
Data Source
AI summary
A scanning probe microscope system. A sample stage is provided along with a microscope arranged to collect data with a probe carried by the microscope from a sample carried by the sample stage. A probe/sample exchange mechanism is arranged to exchange the probe carried by the microscope with a new probe, and is also arranged to exchange the sample carried by the sample stage with a new sample. The probe/sample exchange mechanism comprises a transport structure which can move relative to the microscope and the sample stage; a probe carrier carried by the transport structure and adapted to carry the probe or the new probe when the probe is exchanged with the new probe; a sample carrier carried by the transport structure, wherein the sample carrier is adapted differently from the probe carrier to carry the sample or the new sample when the sample is exchanged with the new sample; and a drive system arranged to move the transport structure relative to the microscope and the sample stage when the probe is exchanged with the new probe and the sample is exchanged with the new sample.