Nanotechnology TRIZ Cases
- AFM Probe Tip Plasmonic Field Enhancement for IR Spectroscopy
A plasmonic AFM probe tip concentrates infrared radiation at the apex, eliminating background absorption and achieving 20 nm spatial resolution.
- Scanning Probe Approach via Electrostatic Feedback
An electric field between the probe tip and sample generates electrostatic force for proximity sensing, enabling rapid approach without mechanical overshoot.
- Spatial Atomic Layer Deposition Nanoparticle Coating
Segmented pipelines isolate precursor stages to resolve agglomeration and contamination, boosting deposition efficiency.
- Semiconductor Light Emitting Device Second Conductive Layer Thickness
Optimizing the second conductive semiconductor layer thickness to 45-100 nm reduces driving voltage and minimizes light absorption within the device.
- Dual-Probe AFM Segmented Cantilevers for Tip-Sample Distance Control
Segmenting the probe assembly into a longer reference tip and shorter imaging tip resolves measurement precision versus device complexity contradictions.
- Inorganic Particle Surface Migration in Functional Plastics
Low viscosity solvent dispersion enables inorganic particle migration to plastic surfaces.
- Scanning Probe Microscope Steep Incline Measurement
A scanning probe microscope uses periodic approach-retract cycles to measure sample shapes without damaging the surface.
- Multi-Head Scanning Probe Microscopy for High Throughput
Parallel scanning with multiple independent probe heads resolves the trade-off between high resolution and low throughput in industrial microscopy.
- SmartTune AFM Resonant Frequency Detection via Thermal Noise
SmartTune algorithm determines AFM resonant frequency using thermal noise spectrum analysis, resolving multiple amplitude peaks in fluid environments.
- Mordenite Zeolite Particle Size Control via Gel Crystallization
Crystallizing a specific gel composition at 150 to 190 degrees Celsius produces mordenite zeolites with controlled particle sizes.