Probe Storage Jig with Movable Guide Plates for Defect Inspection
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Solution Overview
Problem
Existing probe storage systems do not facilitate easy defect checking of probes before they are joined to circuit substrates during the assembly of electrical connection devices.
Innovation Solution
A probe storage jig with a stacked guide plate structure, where first and second guide plates are relatively movable to sandwich the probe, allowing the upper part of the support section and the tip end of the arm to be exposed, enabling visual inspection for defects.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the probe is stored in a conventional jig, then the probe is held in a stable posture, but it is difficult to check for defects in the probe
Solution Approach 1:
The guide plates are made relatively movable to sandwich the probe, transitioning from a static storage structure to a dynamic clamping mechanism. This allows the probe to be securely held during storage while enabling easy access and visual inspection of critical areas by opening the guide plates
Solution Approach 2:
The probe storage jig uses a stacked configuration of first and second guide plates with through-holes, creating a multi-dimensional structure. This stacking arrangement allows the probe to be held stably in three-dimensional space while exposing critical areas for inspection from multiple viewing angles
2Area of stationary object
If the probe is stored in a compact jig, then space is saved, but the probe cannot be easily inspected for defects
Solution Approach 1:
The storage jig is segmented into multiple guide plates (first guide plate, second guide plate) with through-holes, allowing the probe to be stored in a compact stacked arrangement while enabling easy access to inspection areas by moving individual guide plates
Data Source
AI summary
A probe storage jig has a structure in which a first guide plate and a second guide plate are stacked. A through-hole penetrating from an upper surface to a lower surface is formed in each of the first guide plate and the second guide plate. The probe storage jig holds the probe penetrating through the through-hole formed in each of the first guide plate and the second guide plate, in a state in which an upper part of the support section is exposed when viewed from above the probe storage jig and a tip end of a free end of the arm is exposed when viewed from below the probe storage jig. The probe storage jig is configured in such a way that the first guide plate and the second guide plate are movable so as to sandwich the probe between the first guide plate and the second guide plate.