Built-in Processor Analog Testing System
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Solution Overview
Problem
Conventional analog testing systems for integrated circuits face inefficiencies due to long settle times and high costs, particularly when using external test machines and processors, and require preloading of program sequences with conditional jumps that increase testing time and memory requirements.
Innovation Solution
A testing system utilizing a built-in processor within the integrated circuit to execute a program sequence without conditional jumps, where a digital-to-analog converter and analog-to-digital converter are used to convert testing sequences and responses, and an external tester sequentially outputs a fixed program sequence directly to the processor, eliminating the need for memory preloading.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If an external test machine with analog channel is used to test analog DUTs, then the testing system can perform analog testing, but the settle time increases the whole testing time
Solution Approach 1:
The patent merges the test machine functionality with the DUT by integrating a processor directly into the DUT. This processor executes test programs locally, eliminating the need for external analog channels and settle time. The test machine only needs to provide digital test sequences and read digital results, combining the advantages of digital speed with analog testing capability.
Solution Approach 2:
The built-in processor acts as an intermediary between the digital test machine and the analog DUT. It converts digital test sequences into appropriate analog test signals and converts analog test results into digital form, eliminating the need for direct analog connectivity and associated settle time.
2Loss of time
If an external processor is used with built-in DAC and ADC to reduce settle time, then the testing time is reduced, but the cost of external processor increases the cost of testing system
Solution Approach 1:
The DUT serves itself by containing a processor that performs both testing and processing functions. The processor is integrated into the DUT itself rather than being an external component, making the DUT self-testing and eliminating the need for expensive external processing equipment.
Solution Approach 2:
The built-in processor performs multiple functions: it executes test programs, generates test sequences, processes analog signals through integrated DAC/ADC, and outputs test results. This multi-functionality eliminates the need for separate external processor equipment.
3Adaptability or versatility
If a program sequence with conditional jumps is loaded into internal memory for processing, then the processor can perform logical operations, but the memory cost and preloading time increase
Solution Approach 1:
The test program is prepared in advance as a fixed sequence without conditional jumps. All test logic is predetermined and executed in a fixed order, eliminating the need for runtime memory access and conditional branching. This preliminary preparation of the test sequence allows direct execution without preloading.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach reduces testing time and cost by allowing real-time input of program sequences and eliminating the need for buffering memory, resulting in a more efficient and cost-effective analog testing process.
Implementation Method 1
a digital-to-analog converter for converting a digital testing sequence output from the processor into an analog testing sequence fed into the analog design under test
Implementation Method 2
an analog-to-digital converter for converting an analog testing response of the analog design under test into a digital testing response fed into the processor
Data Source
AI summary
A testing system includes an integrated circuit having an analog design under test and a processor; an digital-to-analog converter (DAC), coupled to the analog design under test and the processor, for converting a digital testing sequence output of the processor into an analog testing sequence fed into the analog design under test; a analog-to-digital converter (ADC), coupled to the analog design under test and the processor, for converting an analog testing response of the analog design under test into a digital testing response fed into the processor; and an external tester, coupled to the processor of the integrated circuit, for sequentially outputting a program sequence to the processor; wherein the processor executes the program sequence without un-predictable conditional jump to get a testing result of the testing system and then outputs the testing result to the external tester.