Processor Vector Logical Operation and Test Instructions
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Solution Overview
Problem
Current processor architectures lack efficient instructions for performing bitwise logical operations on packed data elements and testing the results, which limits their ability to perform complex vector operations effectively.
Innovation Solution
Incorporating specific instructions and circuitry that enable processors to perform bitwise logical operations (such as XOR and OR) on packed data, test the results, and apply masking, allowing for efficient execution of vector operations by decoding instructions that indicate the operations to be performed on packed data sources and storing the results in destinations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If traditional processor architectures are used without specific vector logical operation instructions, then the processor can execute basic instructions, but it cannot efficiently perform complex vector operations with parallel processing
Solution Approach 1:
The processor execution circuit is designed to handle multiple operation types (logical AND, OR, XOR, test operations, masking) through a unified instruction format. The opcode field can specify different operations, and the execution circuit automatically configures itself to perform the required operation on packed data elements, enabling one circuit to serve multiple vector processing functions
Solution Approach 2:
The instruction is divided into distinct fields (opcode, operand specifications, mask parameters) that allow the processor to parse and execute different portions of the instruction for different purposes. The packed data itself is segmented into multiple data elements that can be processed in parallel, with each element undergoing the same logical operation independently
2Measurement precision
If the processor lacks dedicated test instructions for logical operation results, then the instruction set remains simple, but the processor cannot effectively test and validate vector operation results
Solution Approach 1:
The test operation is merged with the logical operation instructions. After performing a logical operation (AND, OR, XOR) on packed data elements, the execution circuit automatically performs a test operation on the results without requiring separate instruction sequences. This combining of operations reduces the number of instructions needed while providing comprehensive result validation
Solution Approach 2:
The execution circuit automatically performs test operations on the results of logical operations without external intervention. The circuit self-configures to test the output of the logical operation using the same operational parameters, eliminating the need for separate test instructions and reducing programming complexity
3Adaptability or versatility
If the processor does not support masking operations on test results, then the circuit design remains simple, but the processor cannot perform selective result storage or conditional operations
Solution Approach 1:
The masking mechanism applies different quality states to different portions of the test result. Each data element position can be independently masked or unmasked based on mask parameters, allowing selective storage or processing of specific result elements while leaving others unchanged. This local differentiation enables conditional operations without requiring complex control logic
Data Source
AI summary
Systems, methods, and apparatuses relating to performing logical operations on packed data elements and testing the results of that logical operation to generate a packed data resultant are described. In one embodiment, a processor includes a decoder to decode an instruction into a decoded instruction, the instruction having fields that identify a first packed data source, a second packed data source, and a packed data destination, and an opcode that indicates a bitwise logical operation to perform on the first packed data source and the second packed data source and indicates a width of each element of the first packed data source and the second packed data source; and an execution circuit to execute the decoded instruction to perform the bitwise logical operation indicated by the opcode on the first packed data source and the second packed data source to produce a logical operation result of packed data elements having a same width as the width indicated by the opcode, perform a test operation on each element of the logical operation result to set a corresponding bit in a packed data test operation result to a first value when any of the bits in a respective element of the logical operation result are set to the first value, and set the corresponding bit to a second value otherwise, and store the packed data test operation result into the packed data destination.