Profile Measuring Apparatus Vibration Error Compensation
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Solution Overview
Problem
Conventional 3D profile measurement methods using laser range finders suffer from increased measurement errors due to external vibrations, which deviate the laser beam from its predetermined irradiation angle.
Innovation Solution
A profile measuring apparatus comprising a projecting unit, imaging unit, position acquiring unit, profile calculating unit, deflection detecting unit, and controlling unit, which detects deflections and performs passive and active corrections to minimize measurement errors by adjusting the projection and imaging processes.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If a laser beam is used for 3D profile measurement, then measurement speed and coverage are improved, but measurement precision deteriorates due to vibration-induced beam deviation
Solution Approach 1:
The patent employs a deflection detecting unit that continuously monitors the actual irradiation angle of the laser beam and feeds this information back to the controlling unit. The controlling unit then calculates correction values based on the detected deflection and applies them to the profile measuring unit, creating a closed-loop feedback system that compensates for vibration-induced errors in real-time
Solution Approach 2:
The patent dynamically changes the irradiation parameters of the laser beam by applying correction values to adjust the irradiation angle. The controlling unit modifies the beam direction parameters based on detected deflection, allowing the system to adapt to vibration conditions while maintaining measurement accuracy
2Measurement precision
If passive correction is applied to the profile calculating unit, then measurement precision is improved, but device complexity increases due to additional correction mechanisms
Solution Approach 1:
The patent replaces complex mechanical active correction mechanisms with a software-based passive correction system. Instead of using mechanical actuators to physically adjust the laser beam direction, the system uses a controlling unit that calculates and applies correction values to the profile data mathematically, substituting mechanical complexity with computational processing
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The apparatus effectively reduces measurement errors in 3D profile measurements even under conditions of external vibration, ensuring accurate data acquisition by compensating for deflections in real-time.
Implementation Method 1
the laser beam deviates from a predetermined irradiation angle with vibration being added to the measuring apparatus from the outside
Implementation Method 2
a pattern forming unit which generates the predetermined pattern to be projected onto a surface of the measured object, based on light from a light source
Implementation Method 3
an imaging unit to image the pattern projected by the projecting unit
Data Source
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AI summary
The present invention relates to a profile measuring apparatus with reduced measurement error of a 3D profile due to influence of vibration. The profile measuring apparatus is provided with a profile measuring unit, a position acquiring unit, a profile calculating unit, a deflection detecting unit, and a controlling unit. The profile measuring unit has a projecting unit to project a pattern onto a measured object, and an imaging unit to image the pattern. The position acquiring unit acquires a position of the pattern on the measured object. The profile calculating unit calculates a profile of the measured object, based on image information from the imaging unit and position information from the position acquiring unit. The deflection detecting unit detects deflection of the projecting unit. The controlling unit executes active correction for the profile measuring unit and/or passive correction for the profile calculating unit, based on the deflection of the projecting unit detected by the deflection detecting unit.