Using Optical Means TRIZ Cases

Signal modeling techniques calibrate non-linear phase shifts in white light interferometry to extract accurate surface topography data.

A lidar rotor uses beam duplication units to emit multiple laser beams from single transceiver sources.

An integrated actuator applies counteracting force to stabilize thin-walled profiles, resolving measurement errors caused by manufacturing tolerances.

A profile measuring apparatus detects projecting unit deflection to execute active and passive corrections for accurate 3D data acquisition.

Asynchronous solar sensor calculates sun position centroid using photovoltaic pixel matrix, eliminating sequential scanning overhead.

A time-domain optical metrology system transforms wavelength data to isolate upper layer signals from complex semiconductor structures.

A refitting mechanism positions and presses workpieces to correct flatness deviations using automated measurement feedback.

A dual-grating measurement system uses multiple heads to irradiate grating areas, reducing air fluctuation influence on lithography position control.

Dual illumination source diffraction gratings create independent fringe patterns that cancel common mode errors from contaminants up to 100 micrometers.

A distance measuring element uses a surface pattern composed of non-repeating sub-patterns on different scales to enable precise detection.

Speed synchronization eliminates slipping between the wheel and rim mounting plate, preventing wear on delicate components.

A self-centering laser mandrel system aligns within a golf club hosel bore using o-rings and set screws.

Multi-plane optical measurement determines pipe center and axis, eliminating operator error and reducing cycle time in field conditions.

Adjusting the aperture stop position resolves tilt angle limitations for convex or concave surface measurement.

A multi-beam optical apparatus emits lights with distinct beam diameters to measure distances and extract object features.

Non-contact laser measurement determines surface flatness with 0.001 mm precision.

Capacitive sensing circuit determines MEMS mirror position, eliminating bulky laser sources and auxiliary interferometers to reduce system complexity.

A vehicle wheel alignment measurement system uses a graphical interface to select and customize axle configurations for heavy-duty trucks.

Laser scanning captures surface deviations to compute shim gaps, eliminating mechanical tolerance accumulation in large aircraft assemblies.

A metallic bipolar plate integrates measuring structures formed by cuts and deformations to enable orthogonal light transmission.

Rotating object holder enables non-contact scanning of optical component surfaces, resolving wedge error determination without adding device complexity.

A combined scale and scanning unit splits light beams into partial rays for position detection.

LED meters replace mechanical imagers for continuous diameter and pitch tracking, resolving speed versus precision trade-offs.

A non-stop image measuring system captures instantaneous data while moving the imaging means across measurement positions.

Automated optical measurement replaces manual techniques to eliminate technician-dependent quality variations and reduce vibration-causing misalignment errors.

Infrared measurement with interference filters determines silicone concentration, resolving manual metering inaccuracies and staining issues.

Detecting peak intersection points averages beam positions to resolve positioning errors caused by signal slope and width in transparent tube measurements.

A proximity sensor uses a segmented light receiving device with arbitrarily selectable parts to reduce crosstalk.

Movable optical cells and flexible lenses adjust focal axes to resolve resolution limits in static filters.

Optical reflectance profiles determine electron injection layer thickness without damaging sensitive organic devices.

An optical encoder uses an intermediary cover plate between the rotary pattern and fixed body to block foreign objects.

A scanning system uses an encoder to measure distance from a support structure, enabling continuous 3D measurement of long shafts.

SLIT achieves label-free 3D imaging by scanning focus and modulating spatial frequency components to resolve internal cell structures without photobleaching.

A seed sensor lightpipe photodetect assembly uses a segmented LED array and current profiling to enhance spatial resolution.

A two-dimensional sensor measures separation distance to an inner surface without physical contact.

Movable reference mirrors rapidly change optical path to resolve detection efficiency bottlenecks.

A distance measuring apparatus emits three pulsed beams with identical waveforms to detect reflected light signals for accurate depth mapping.

A photoelectric conversion element uses an insulating layer with through-holes to generate currents proportional to light density.

A non-contact optical probe uses a digital mirror device to reflect selected parts of linear laser light for sequential object irradiation.

Analysis apparatus detects phase shift errors using Lissajous figures and corrects signal components to improve measurement accuracy.

Multi-angle conical illumination scans tubular surfaces concurrently, eliminating contact deformation and enabling precise 3D profiling.

Stationary cameras track reflective patterns on spinning shafts to measure alignment errors without contact, eliminating the need for plant shutdowns.

A deformable membrane transmits light to an imaging train, capturing tactile deformation and proximity data simultaneously.

A variable refractive power focusing device adjusts optical focus without mechanical movement.

Polarized receiver analyzer selects return beam components to filter solar interference and improve signal noise ratio.

A fresneled axicon generates concentric ring patterns for corneal topography analysis.

A time-of-flight illuminator uses a tiltable mirror to direct light onto specific regions of interest within the camera field of view.

Movable optic devices adjust magnification settings to change measurement resolution without physical dismantling.

A MEMS mirror adjusts electromagnetic wave emission direction, reducing discrepancies between estimated and actual paths to enhance detection accuracy.