Programmable Electrolytic Mask for Reconfigurable Lithography Patterns

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Solution Overview

Problem

Existing masks in lithography technology are costly, difficult to alter, and prone to defects, leading to increased production costs and complexity, especially in small-batch chip production, and current direct writing methods have low yield and high costs.

Innovation Solution

A mask with an electrolytic reaction layer and control circuit layers that allow for programmable control of light-transmitting states by controlling the deposition and dissolution of metal elements, enabling pattern alteration and reuse.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If a traditional mask is prepared, then the pattern structure can be formed for lithography, but the pattern cannot be easily altered and defects are difficult to repair

Engineering Contradiction:
Improvepattern alterabilityVSAvoidmask structure complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The mask employs an electrolytic reaction layer that can dynamically change its light-transmitting state through electrochemical reactions. By applying control voltages, metal elements in the electrolytic layer can be deposited or dissolved, enabling the mask pattern to be dynamically altered and reconfigured for different lithography applications.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The mask utilizes changes in the physical and chemical parameters of the electrolytic reaction layer to achieve pattern modification. The light-transmitting state is controlled by changing the deposition amount of metal through electrochemical reactions, allowing the same mask structure to produce different patterns by adjusting electrochemical parameters.

Inventive Principle:
Principle #35Parameter changes

2Reliability

If a traditional mask is used, then lithography can be performed, but the mask has high cost and is difficult to repair

Engineering Contradiction:
Improvemask durability and reusabilityVSAvoidmask manufacturing cost
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The mask design allows for the recovery and reuse of the expensive mask structure. When defects occur or pattern changes are needed, the electrolytic reaction layer can be reconfigured or repaired electrochemically without replacing the entire mask, thereby extending mask life and reducing manufacturing costs.

Inventive Principle:
Principle #34Discarding and recovering

Solution Approach 2:

The patent replaces mechanical/physical mask modification methods with electrochemical control. Instead of physically altering or repairing mask structures, the invention uses electrochemical reactions to deposit or dissolve metal in the electrolytic layer, enabling non-contact, precise, and reversible pattern changes.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Productivity

If direct writing methods are used for small-batch production, then flexibility is improved, but yield is low and cost is high

Engineering Contradiction:
Improveproduction yieldVSAvoidmanufacturing cost
Core Design Contradiction:
ProductivityVSEase of manufacture

Solution Approach 1:

The mask serves multiple functions: it can be used for high-volume production with pattern change capabilities and for small-batch production with high flexibility. The same mask structure supports both mass production requirements and customized production needs, eliminating the need for separate direct writing equipment and improving overall productivity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables cost-effective, reusable, and programmable lithography masks that reduce production costs and improve yield, facilitating small-batch chip production and high integration.

Implementation Method 1

a light-transmitting state of a pixel region in the mask is configured to be decided by a control voltage between at least a part of the first control electrode and at least a part of the second control electrode contained in the pixel region, and the control voltage controls the light-transmitting state of the pixel region by controlling a deposition amount of metal in the electrolytic reaction layer

Methodology Applied
Scientific EffectElectrolysis: Electrolysis

Implementation Method 2

an electrolytic reaction layer in which metal element is configured to be in a deposited-metal state or a dissolved-ion state

Methodology Applied
Scientific EffectElectrochemical reaction: Redox Reactions

Data Source

PatentUS20250299954A1Mask, lithographing apparatus and method for manufacturing mask
Publication Date: 2025.09.25 WESTLAKE UNIV
  • US20250299954A1 patent drawing
  • US20250299954A1 patent drawing
  • US20250299954A1 patent drawing

AI summary

A mask, a lithographing apparatus, and a method for manufacturing a mask, wherein the mask includes: an electrolytic reaction layer (110) in which metal element is configured to be in a deposited-metal state or a dissolved-ion state; a first control circuit layer (120) provided on a first side of the electrolytic reaction layer (110) and including a plurality of first control electrodes (121); and a second control circuit layer (130) provided on a second side of the electrolytic reaction layer (110) that is opposite to the first side and including a plurality of second control electrodes (131), wherein a light-transmitting state of a pixel region in the mask is configured to be decided by a control voltage between at least a part of the first control electrode (121) and at least a part of the second control electrode (131) contained in the pixel region, and the control voltage controls the light-transmitting state of the pixel region by controlling a deposition amount of metal in the electrolytic reaction layer (110).