Programmable Ring Oscillators for On-Chip Timing Correlation
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Solution Overview
Problem
Existing techniques for measuring propagation delays in integrated circuits are costly and inefficient, as they require numerous on-chip test structures and off-chip measurement circuits, leading to increased space and complexity on the chip.
Innovation Solution
The development of integrated circuits with programmable circuitry and controllers that generate and manipulate oscillator signals to determine central tendencies and variances of propagation delay, using programmable ring oscillators and delay paths that can be configured based on control signals.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If numerous on-chip test structures and off-chip measurement circuits are used to measure propagation delays, then measurement accuracy is improved, but device complexity and manufacturing cost increase
Solution Approach 1:
The patent combines the measurement circuit functionality directly into the programmable logic device itself, merging what were previously separate off-chip measurement circuits with on-chip test structures into a unified integrated solution. This integration reduces the need for extensive external test equipment while maintaining measurement accuracy through on-chip oscillation frequency measurements.
Solution Approach 2:
The measurement system uses the programmable logic device's own internal resources (oscillators, logic elements, and programmable interconnects) to perform self-measurement of propagation delays. The device measures its own timing characteristics by configuring internal oscillators and measuring their frequencies, eliminating the need for extensive external test equipment.
2Measurement precision
If numerous on-chip test structures are implemented, then measurement precision is improved, but area occupied on the chip increases
Solution Approach 1:
The patent implements universal measurement circuits that can measure propagation delays across multiple logic elements and paths using a single integrated measurement system. The programmable oscillator and measurement logic can be configured to test different portions of the device, eliminating the need for dedicated test structures for each logic element and significantly reducing the total area required.
3Measurement precision
If extensive test structures are used, then measurement accuracy is improved, but manufacturing cost increases
Solution Approach 1:
The measurement system uses the programmable logic device's own internal resources (oscillators, logic elements, and programmable interconnects) to perform self-measurement of propagation delays. The device measures its own timing characteristics by configuring internal oscillators and measuring their frequencies, eliminating the need for extensive external test equipment.
Data Source
AI summary
Described herein are improved techniques for measuring propagation delay of an integrated circuit that facilitate performing propagation delay measurements on-chip. Some embodiments relate to an integrated circuit comprising programmable oscillator circuitry with a plurality of oscillator stages that are switchable into and out of a delay path based on control signals from a controller, allowing the same programmable oscillator to generate many different oscillator signals according to the received control signals, for the controller to determine a central tendency and/or variance of propagation delay of the integrated circuit. Some embodiments relate to an integrated circuit including programmable delay paths configured to provide an amount of cell delay and an amount of wire delay based on control signals from a controller, allowing the same programmable delay path to generate signals for measuring delays due to cell and wire delays of the integrated circuit.