Protocol-Aware Trigger Generation for Low-Latency Test Equipment
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Solution Overview
Problem
Conventional automated test equipment experiences high transmission delays, limited real-time performance, and multi-site inefficiencies due to centralized trigger generation and direct PC-based connections, which affect signal accuracy and test flow responsiveness, especially in complex electronic devices with non-deterministic and protocol-aware interfaces.
Innovation Solution
Implementing a protocol-aware trigger generation unit within the device communication unit, closely coupled to the device under test, to extract payload data and generate triggers directly, reducing latency and improving timing accuracy by decentralizing the trigger generation process.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If centralized trigger generation is used, then device complexity is reduced, but transmission delay increases and real-time performance deteriorates
Solution Approach 1:
The patent segments the trigger generation function by implementing distributed trigger generation units at each device communication unit rather than centralized generation. Each device communication unit independently generates triggers locally, eliminating the need for data transmission to a central unit and thereby reducing transmission delay while maintaining manageable system complexity through modular distribution.
Solution Approach 2:
The patent introduces device communication units as intermediary components between the device under test and the main test flow control. These intermediaries perform trigger generation locally without requiring direct communication with the central control unit, thereby reducing transmission delay while maintaining system coordination through the communication unit interface.
2Ease of operation
If direct PC-based connection is used, then ease of operation is improved, but multi-site efficiency decreases and signal accuracy is compromised
Solution Approach 1:
The patent introduces device communication units as intermediary components that provide standardized, protocol-aware interfaces between the device under test and the test equipment. These intermediaries handle protocol conversion and data formatting, ensuring signal accuracy and timing precision while maintaining ease of operation through standardized connection interfaces that abstract away complex protocol details.
3Measurement precision
If protocol-aware trigger generation is implemented, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The patent implements protocol-aware trigger generation units that are integrated into device communication units, making these units multi-functional by handling both data communication and trigger generation for various protocols. This universal approach improves timing accuracy through protocol-specific processing while avoiding the need for separate complex protocol handlers, thereby managing overall system complexity.
Data Source
AI summary
An automated test equipment comprises a main test flow control configured to operate a test flow in multiple device communication units and/or to provide the trigger configuration information to a local compute unit. The automated test equipment further comprises a device communication unit comprising a trigger generation unit configured to generate a trigger signal. The trigger generation unit further configured to extract payload data from a protocol-based data stream received from the device under test, and to generate the trigger signal in response to the extracted payload data or in response to one or more protocol events. A method and a computer program for testing one or more devices under test in an automated test equipment are also disclosed.