PTAT Generator Thermal Shutdown Testing

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Solution Overview

Problem

Current methods for testing thermal shutdown characteristics in integrated circuits are inefficient and costly, as they require physically raising the temperature of the IC, which is time-consuming and stressful, and do not provide a quantitative mechanism to determine the activation temperature of the thermal protection mechanism.

Innovation Solution

A system and method that utilize a PTAT generator to provide a temperature-proportional signal, enabling the measurement of electrical parameters associated with the thermal protection control system, allowing for the determination of thermal activation characteristics without physically increasing the IC's temperature, which can be implemented at any stage of fabrication, including final packaging.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If thermal shutdown control circuitry is tested by physically raising the temperature of the IC device to the thermal shutdown activation temperature, then the operation of the thermal detection circuitry can be tested, but the testing process becomes time-consuming and costly, significantly decreasing device yield

Engineering Contradiction:
Improvethermal detection circuitry operationVSAvoiddevice yield
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent creates an electrical copy or simulation of the thermal conditions by injecting a test current through the PTAT circuit that mimics the electrical signature of high temperature operation. This allows the thermal detection circuitry to be tested without physically heating the device, thereby maintaining high device yield while still verifying thermal protection functionality.

Inventive Principle:
Principle #26Copying

Solution Approach 2:

The patent changes the operational parameters of the PTAT circuit by injecting a controlled test current that alters the circuit's electrical characteristics to simulate thermal activation conditions. This parameter change enables the detection circuitry to respond as it would under actual thermal stress, allowing functional testing without physical temperature elevation.

Inventive Principle:
Principle #35Parameter changes

2Reliability

If existing test procedures control and override thermal shutdown signal to activate the protection circuitry, then the protection mechanism can be tested, but no quantitative mechanism is provided to ascertain the activation temperature

Engineering Contradiction:
Improveprotection mechanism functionVSAvoidactivation temperature determination
Core Design Contradiction:
ReliabilityVSMeasurement precision

Solution Approach 1:

The patent implements a feedback mechanism where the test current injected into the PTAT circuit is precisely controlled and measured, and the response of the thermal detection circuitry is monitored. By measuring the test current required to activate the protection circuitry and using the known relationship between PTAT current and temperature, the system calculates and reports the precise activation temperature, providing both functional verification and quantitative measurement.

Inventive Principle:
Principle #23Feedback

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables the determination of thermal activation temperature economically and as part of routine testing, providing a quantitative assessment of thermal protection characteristics without stressing the IC, thus improving the efficiency and cost-effectiveness of the testing process.

Implementation Method 1

a PTAT (proportional to absolute temperature) circuit, such as a current PTAT (or IPTAT) circuit. The IPTAT circuit provides an output current that is proportional to the absolute temperature of the components constituting the circuit.

Methodology Applied
Scientific EffectPTAT (Proportional to Absolute Temperature) effect:

Data Source

PatentUS7408369B2System and method for determining thermal shutdown characteristics
Publication Date: 2008.08.05 TEXAS INSTRUMENTS INC
  • US7408369B2 patent drawing
  • US7408369B2 patent drawing
  • US7408369B2 patent drawing

AI summary

Systems and methods are disclosed to enable determining thermal protection characteristics of an integrated circuit. In one embodiment, an integrated circuit includes a proportional to absolute temperature (PTAT) generator that provides a PTAT signal that varies as a function of temperature. Thermal protection control system provides an output signal indicative of a thermal protection condition based at least in part on the PTAT signal. A monitoring system that provides a path to enable selective measuring of at least one signal associated with operation of the thermal protection control system.