Electronic Circuit Testing TRIZ Cases
- Microscope Objective Adapter for Semiconductor Probe Integration
An objective adapter integrates a manipulator and probe head onto a microscope frame to enable precise sample positioning.
- On-Chip Temperature Monitoring via Diagnostic Logic Piggybacking
Diagnostic logic piggybacks on native circuit paths to detect timing errors from over-temperature conditions without requiring complex calibration.
- Automated DFT Channel Insertion in Chip Modules
Automated DFT channel insertion across chip hierarchies resolves design entity management complexity.
- BIST Circuit Weight Select Logic for Fault Coverage
Dynamic weight selection resolves the contradiction between hardware complexity and fault detection capability in built-in self-test circuits.
- PTAT Generator Thermal Shutdown Testing
PTAT generator enables thermal shutdown testing without physical heating to improve yield.
- In-situ Semiconductor Aging Sensors
In-situ reliability sensors model semiconductor aging through self-digitizing networks, resolving measurement precision versus device complexity.
- Socketless QFN Test Board with Toggle Pogo Pin Mechanism
A socketless test board uses a toggle member and pogo pins to apply controlled pressure for flushmount electrical contact.
- Self Learning Signatures for Anomaly Detection
Automated baseline signatures enable immediate abnormality detection in computing systems.
- Locomotive DC Bus Ground Fault Detection via Forcing Function
Applying a unique augmenting signal to the DC bus reveals transient insulation weaknesses, preventing unexpected shutdowns.
- Indirect Voltage Measurement Circuit Using Transconductance Converter
A testing circuit measures charge pump output voltage indirectly using a transconductance converter device operating in saturation.
- JTAG Clock Synchronization via Composite Return Signal
Selection units generate synchronized return clock signals for selected modules and combine them into a composite signal.