Pulse Laser Testing for Wide-Bandgap Power Device Transients
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Solution Overview
Problem
Existing pulse laser irradiation experimental apparatuses for wide bandgap power devices face challenges in accurately locating sensitive regions, capturing high-frequency transient currents, evaluating electrical characteristics before and after irradiation, determining sensitive conditions, and simulating irradiation resistance under power conditions.
Innovation Solution
An experimental apparatus comprising an optical path coupling system, circuit test system, temperature control system, and interaction control system, which includes a pulse laser control unit, energy control unit, piezoelectric displacement unit, image acquisition unit, and FPGA, to automatically locate sensitive regions, capture transient currents, and evaluate electrical characteristics under various conditions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If traditional irradiation apparatuses (neutron sources, proton sources, heavy ion sources) are used, then irradiation experiments can be conducted, but experimental machine hours are limited and experimental costs are high
Solution Approach 1:
The patent replaces traditional mechanical irradiation sources (neutron sources, proton sources, heavy ion sources) with a pulse laser system. The pulse laser irradiates the wide bandgap power device through optical paths, substituting complex mechanical irradiation apparatus with an optical system that offers higher experimental efficiency and lower costs while maintaining irradiation experiment reliability
Solution Approach 2:
The patent changes the irradiation parameter from particle beams to optical parameters (wavelength, pulse width, energy density) of the pulse laser. This parameter change enables flexible adjustment of irradiation conditions and significantly improves experimental productivity compared to traditional fixed-parameter irradiation sources
2Reliability
If test apparatuses are located far away from tested devices in irradiation chambers with protection, then device safety is ensured, but test data accuracy is low and test efficiency is poor
Solution Approach 1:
The patent introduces an optical path coupling system as an intermediary between the pulse laser and the device under test. This system includes optical lenses, mirrors, and coupling components that allow precise control of laser irradiation while enabling testers to operate from a safe distance, thus maintaining both device safety and test data accuracy through optimized optical coupling
Solution Approach 2:
The patent segments the testing system into distinct functional modules: pulse laser control unit, optical path coupling system, probe station for electrical connection, and data acquisition system. This segmentation allows each module to be optimized independently, with the optical path coupling system bridging the gap between safe operator distance and precise measurement requirements
3Ease of operation
If manual positioning of sensitive regions is performed, then device structure can be observed, but coordinates of sensitive regions cannot be accurately located and positioning efficiency is low
Solution Approach 1:
The patent implements an automated positioning system where the control system automatically identifies and positions the sensitive regions of the device based on pre-stored coordinate information. The system self-adjusts the optical path and probe positioning without manual intervention, achieving high positioning accuracy and efficiency while maintaining ease of operation through automated workflows
Solution Approach 2:
The patent employs feedback mechanisms where the system continuously monitors the position of the pulse laser relative to the device structure and automatically adjusts positioning based on real-time detection. The control system receives feedback from position sensors and coordinate databases to precisely locate sensitive regions, ensuring both ease of operation and high measurement precision
4Measurement precision
If high-bandwidth transient pulse current is captured, then irradiation effects can be detected, but capture difficulty increases and measurement complexity increases
Solution Approach 1:
The patent merges the current measurement and voltage measurement systems into a synchronized data acquisition unit that simultaneously captures both signals with high bandwidth. By combining these measurement functions into an integrated system with synchronized timing, the patent reduces overall system complexity while maintaining high measurement precision for transient pulse current detection
Solution Approach 2:
The patent replaces complex passive current measurement methods with an active electronic measurement system that uses high-bandwidth transimpedance amplifiers and digital oscilloscopes. This substitution of measurement methodology enables accurate capture of transient pulse currents while simplifying the overall measurement system through electronic signal processing rather than complex mechanical or passive electrical arrangements
5Measurement precision
If comprehensive sensitive conditions are determined, then irradiation resistance can be evaluated, but testing time increases and experimental costs increase
Solution Approach 1:
The patent performs preliminary characterization of the device to identify sensitive regions and conditions before conducting full irradiation testing. By pre-mapping the device structure and electrical characteristics, the system can focus subsequent irradiation tests on identified sensitive areas, thereby determining comprehensive sensitive conditions with high accuracy while significantly reducing overall testing time and costs
Solution Approach 2:
The patent implements a staged testing approach where initial tests use partial irradiation conditions to identify sensitive regions, followed by focused comprehensive testing only on those identified sensitive areas. This partial action strategy enables determination of comprehensive sensitive conditions with high accuracy while avoiding the time and cost expense of exhaustive testing under all possible conditions
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The apparatus enables comprehensive and accurate determination of sensitive conditions, simultaneous capture of transient pulse currents, and evaluation of irradiation resistance, with high measurement bandwidth and low waveform distortion, facilitating automatic testing of hundreds of devices.
Implementation Method 1
an optical path coupling system, configured to direct pulse laser onto a surface of a wide bandgap power device to be tested
Implementation Method 2
a piezoelectric displacement unit, configured to adjust a position of the wide bandgap power device or a focal plane of the pulse laser
Implementation Method 3
a circuit test system, which is electrically connected to a gate, a drain, and a source of the wide bandgap power device through three probes of a probe station respectively, and is configured to perform an electrical characteristic test, a dynamic switching test, and a transient current test
Data Source
AI summary
The present invention discloses an experimental apparatus and a test method for a pulse laser irradiation wide bandgap power device. The apparatus includes an optical path coupling system, a circuit test system, a temperature control system, and an interaction control system. According to the present invention, irradiation sensitive region locating, irradiation transient current tests, irradiation sensitive condition tests, and irradiation degradation tests for the wide bandgap power device are implemented, and advantages of convenience in experiments, simple operation, automated tests, comprehensive and accurate test results, and the like are achieved.