Pulsed Laser SEL Testing with Detection and Reset Circuit
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Solution Overview
Problem
Current methods for testing single-event latchup (SEL) in electronic components are inefficient, as they cause significant heating and difficulty in determining which laser pulse triggers the event, leading to potential device damage, and existing radiation data may not be applicable to newer parts due to fabrication process changes.
Innovation Solution
A method using a pulsed laser unit with a detection and reset circuit (DARC) to apply series of laser pulses, measure energy, detect latchup, automatically break the current path, and restart the device quickly, allowing for precise determination of threshold energy and minimizing damage.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional heavy-ion beam methods are used to measure SEL, then accurate SEL rate estimation is achieved, but testing cost and time increase significantly
Solution Approach 1:
The patent uses pulsed laser beams to simulate the effects of heavy-ion radiation on semiconductor devices. Instead of using actual heavy-ion beams from particle accelerators, the invention creates optical copies of the radiation effects by generating electron-hole pairs through high-energy laser pulses, thereby replicating the single-event latchup conditions without requiring expensive radiation facilities
Solution Approach 2:
The patent replaces the mechanical/particle-based heavy-ion beam system with an optical laser system. By substituting the physical particle acceleration infrastructure with laser optics, the invention achieves comparable measurement capabilities while eliminating the need for large-scale accelerator facilities, thus reducing both cost and testing time
2Measurement precision
If continuous monitoring is used to detect latchup events, then detection accuracy is improved, but response time increases causing device damage
Solution Approach 1:
The patent employs periodic pulsed laser illumination instead of continuous monitoring. The laser delivers short, intense pulses at controlled intervals, allowing the device to return to normal operation between pulses. This periodic approach enables detection of latchup events while minimizing the time the device spends in a monitored state, thereby improving response speed without sacrificing detection accuracy
Solution Approach 2:
The invention uses brief laser pulses that rapidly probe the device state and immediately terminate, rather than maintaining continuous observation. This 'rushing through' approach allows the system to gather necessary detection information in minimal time, enabling fast response to latchup events before damage occurs
3Reliability
If laser pulse energy is increased to ensure latchup triggering, then detection reliability is improved, but device damage risk increases
Solution Approach 1:
The patent implements dynamic adjustment of laser pulse parameters including energy, duration, and repetition rate. By making these parameters variable rather than fixed, the system can optimize the balance between reliably triggering latchup events and maintaining device safety. The laser energy can be increased when needed to ensure detection, then reduced to minimize damage risk, providing flexible control over the trade-off between reliability and harm
4Measurement precision
If multiple laser pulses are applied to determine threshold energy, then measurement accuracy is improved, but the time to identify triggering pulses increases
Solution Approach 1:
The patent incorporates feedback mechanisms that monitor device response to each laser pulse in real-time. When a latchup event is detected, the system immediately records the corresponding pulse parameters and adjusts subsequent pulse delivery accordingly. This feedback loop enables the system to identify threshold energy with fewer pulses by learning from each measurement, thereby improving accuracy while reducing the total time required
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables rapid detection and mitigation of SEL, reducing device damage and providing accurate threshold energy determination for improved design and testing of electronic parts, even for newer components with unknown fabrication processes.
Implementation Method 1
applying, via a pulsed laser unit, a series of laser pulses to a testing object
Data Source
AI summary
Systems and methods are provided for testing a threshold energy required to cause a latchup on an electronic component. An exemplary method includes applying a series of laser pulses to a testing object with a pulsed laser unit. The testing object is connected to a testing circuit which can measure the energy of each of the series of laser pulses, and detect whether a pulse of the series of laser pulses resulted in a latchup on the testing object. Upon detecting the pulse, the method provides for logging the energy of the pulse using a recording unit and logging the latchup status of the test device. If a latchup is detected, the testing circuit automatically mitigates the latchup event.