Quick Error Detection Test Program Insertion for Logic Device Verification
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Solution Overview
Problem
Current pre-silicon verification and post-silicon validation processes for logic-based processing devices face challenges with high error detection latency, making it difficult to localize bugs, and are often time-consuming and costly due to manual creation of test programs and reliance on simulation, which is slower than physical testing.
Innovation Solution
The systematic generation of Quick Error Detection (QED) test programs with additional instructions inserted at strategic locations within the original test programs to improve bug detection coverage and reduce error detection latency, utilizing hardware Proactive Load and Check (PLC) checkers to verify expected behavior.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Loss of time
If conventional test programs are used without additional check instructions, then the test execution is simpler and faster per instruction, but the error detection latency becomes very long making bug localization difficult
Solution Approach 1:
The patent applies preliminary action by inserting check instructions at strategic locations within the test program before errors can propagate through many instructions. These check instructions proactively verify intermediate results and detect errors early in the execution sequence, preventing long error detection latencies that would otherwise occur when errors are only detected at the end of test execution.
Solution Approach 2:
The patent uses check instructions as intermediary elements that mediate between the original test instructions and the error detection process. These check instructions serve as intermediate verification points that break down the long error detection latency into smaller segments, allowing errors to be detected closer to their origin without requiring complete test program execution.
2Productivity
If manual test program creation is used, then the test programs can be customized for specific scenarios, but the process becomes time-consuming and costly
Solution Approach 1:
The patent applies self-service by enabling automatic generation of test programs with check instructions inserted at strategic locations. The system autonomously analyzes the original test program, identifies appropriate insertion points for check instructions, and generates the enhanced test program without requiring manual intervention, thereby significantly improving productivity while reducing the time and cost associated with manual test program creation.
Solution Approach 2:
The patent extracts the labor-intensive manual test program creation process and replaces it with an automated system. By taking out the manual authoring, analysis, and optimization tasks from the human operator, the system achieves rapid generation of optimized test programs with properly placed check instructions, eliminating the time and cost overhead of manual processes.
3Reliability
If simulation is used for pre-silicon verification, then bugs can be detected before manufacturing, but the verification process is much slower than physical testing
Solution Approach 1:
The patent applies parameter changes by modifying the test program structure to include check instructions that enable more frequent and earlier error detection. This structural parameter change allows the verification process to maintain high bug detection capability while reducing the effective verification time by detecting errors before they propagate through large numbers of instructions, thereby improving the speed-efficiency of the simulation process.
Data Source
AI summary
A method of operating a test device for a logic-based processing device includes the steps of providing an original set of test instructions, generating one or more Quick Error Detection (QED) test programs, and causing the one or more QED test programs to be executed on the logic-based processing device. Each one of the QED test programs includes the original test program with additional instructions inserted at strategic locations within the original set, wherein the additional instructions and the strategic locations vary between each of the QED test programs.


