Detecting Faulty Computer Hardware TRIZ Cases
- Dynamic Functional Simulation Sampling for Timing Accuracy
A monitoring component triggers timing simulation during functional phase transitions to enhance accuracy.
- Virtual Data Service Appliance Parallel Disk Image Testing
A virtual data service appliance intercepts I/O requests to enable parallel testing of multiple disk images without duplicating storage.
- Filtering Manager for Virtual Hardware Memory Access Redirection
A filtering manager identifies illegal memory access instructions in device drivers and redirects them to mapped locations within virtual hardware models.
- System-of-systems integration point specification
A system-of-systems method specifies integration points by generating interface attributes to link architecture and design phases.
- Semiconductor Signal Detection Arrangement for Local Attack Identification
A semiconductor detection arrangement compares signals at different driver stages to identify potential internal attacks.
- CMOS Analog Component Context Variation Reduction
A cover layer identifies sensitive analog components in integrated circuit designs for targeted design rule enforcement.
- Communication Test Device Using Process Control Block Hooking
A communication test apparatus hooks a test agent into the process control block to intercept inter-process events.
- Leakage Current Estimation Using Global and Local Variation Segmentation
A leakage current estimation method segments global process corners and local variations to calculate cumulative distribution functions for semiconductor designs.
- Vehicle Diagnostic Reset via Optical VIN Recognition
A mobile diagnostic device captures vehicle identification data using optical character recognition to retrieve specific reset procedures.
- RTL Signal Mapping for Gate-Level Debugging
A synthesizer generates waveform data for internal signals using logical relationships preserved in non-optimized netlists.
- Robotic Touch Screen Latency Measurement System
A robotic member interacts with a touch screen while a video camera records the display response for automated latency analysis.
- Yield Prediction System for IC Design Layouts
A yield prediction system differentiates systematic and random defects to calculate accurate wafer outcomes.
- Dose Data Generation Using Virtual Data Mirroring
Mirrors shot region measurement data to non-shot areas prevents divergence and jump values at shot edges during photolithography.