Solid-State Device Integrity Cells for Radiation Error Detection

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Solution Overview

Problem

Modern semiconductor electronics are susceptible to radiation-induced errors, such as soft and hard errors, which affect memory and logic circuits, leading to reliability issues in radiation environments.

Innovation Solution

A solid-state device design incorporating integrity cells and a collection circuit that detects radiation-induced corruption by reading neighboring integrity cells, which are more susceptible to disruption, and uses a lower power supply voltage to enhance sensitivity. An error detection and correction circuit verifies and corrects errors in logic circuits, employing electric fields to direct ions away from critical logic circuits.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If integrity cells are powered by a lower power supply voltage to enhance sensitivity to radiation, then the ability to detect radiation-induced errors is improved, but the integrity cells become more susceptible to disruption

Engineering Contradiction:

Improveradiation error detection sensitivityVSAvoidintegrity cell state stability

Core Design Contradiction:

Measurement precisionVSReliability

Solution Approach 1:

The patent applies beforehand cushioning by providing a reset mechanism that restores integrity cells to their predetermined state after radiation-induced disruptions. The reset signal is generated in response to detecting an incorrect bit in an integrity cell, thereby cushioning against the adverse effects of radiation by preparing a recovery mechanism in advance.

Inventive Principle:

Principle #11Beforehand cushioning (Prior cushioning)

2Measurement precision

If integrity cells are arranged in a pattern neighboring logic circuits, then the ability to detect corruption in logic circuits is improved, but the device complexity increases

Engineering Contradiction:

Improvecorruption detection accuracyVSAvoidcircuit structure complexity

Core Design Contradiction:

Measurement precisionVSDevice complexity

Solution Approach 1:

The patent applies segmentation by dividing the device into distinct functional components: logic circuits for performing operations, integrity cells for detecting radiation effects, and a reset mechanism for recovery. This segmentation allows each component to be optimized independently while working together to solve the radiation error detection problem.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The patent uses integrity cells as intermediaries between the radiation environment and the logic circuits. These integrity cells act as sensors that detect radiation-induced changes and trigger reset signals, mediating the interaction between radiation and logic circuits without requiring direct modification of the logic circuits themselves.

Inventive Principle:

Principle #24Intermediary (Mediator)

3Speed

If the collection circuit reads integrity cells frequently to detect errors early, then the detection speed is improved, but the energy consumption increases

Engineering Contradiction:

Improveerror detection speedVSAvoidcollection circuit power consumption

Core Design Contradiction:

SpeedVSUse of energy by moving object

Solution Approach 1:

The patent implements periodic action by having the collection circuit read integrity cells at regular intervals or under specific conditions (such as after radiation exposure events). This periodic reading strategy balances early error detection with energy conservation, avoiding continuous monitoring while maintaining effective surveillance.

Inventive Principle:

Principle #19Periodic action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The design effectively detects and corrects radiation-induced errors in logic circuits by utilizing integrity cells and electric fields, enhancing reliability in radiation environments.

Implementation Method 1

the substrate receives an ionizing radiation... causes a heavily ionized deposition of charges along a track

Methodology Applied

Scientific EffectIonization: Ionisation

Implementation Method 2

employing electric fields to direct ions away from critical logic circuits

Methodology Applied

Scientific EffectElectric field: Electric Field

Data Source

PatentUS12461813B2Radiation induced error detection in solid-state devices

Publication Date: 2025.11.04 THE BOEING CO

AI summary

A solid-state device having a substrate that receives an ionizing radiation, logic circuits, integrity circuits, and a collection circuit. The logic circuits are operational to perform logic functions. The logic circuits are located in an area on the substrate, and are individually susceptible to a possible corruption by the ionizing radiation. Each integrity cell is initialized to a predetermined state. The integrity cells are located in the area on the substrate, arranged in a pattern neighboring the logic circuits, and individually susceptible to disrupting the predetermined state in response to the ionizing radiation. The collection circuit is located on the substrate. The collection circuit is operational to read the plurality of integrity cells, and assert a report signal that identifies the possible corruption in a subset of the logic circuits due to the ionizing radiation in response to reading an incorrect state in a neighboring one of the integrity cells.