Read Disturb Information Determination for Storage Subsystems
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Solution Overview
Problem
Conventional read temperature identification systems in information handling systems are costly, complex, and inaccurate, requiring dedicated host memory and power-fail safety measures, and often introduce performance issues due to host processor involvement, with limited granularity and resilience to changing workloads.
Innovation Solution
A storage device with a processing system and memory that uses a read disturb information determination engine to identify error correction information and determine read disturb information, generating a read temperature for storage subsystems based on error-prone bits, allowing for local and global logical storage element read temperature mapping without relying on host processors.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional read temperature identification systems use dedicated host memory and host processor involvement, then read temperature tracking capability is provided, but system cost and complexity increase
Solution Approach 1:
The storage device autonomously determines read disturb information and generates read temperature data using its own processing system, eliminating the need for host processor involvement. The storage device monitors its own read operations and uses error correction information to identify frequently accessed logical storage locations, making the system self-sufficient and reducing host system complexity.
Solution Approach 2:
The read temperature identification function is extracted from the host system and transferred to the storage device. By removing the dependency on dedicated host memory and host processor resources, the solution eliminates the associated costs and complexity while maintaining the capability to identify hot and cold data.
2Reliability
If conventional systems implement power-fail safety measures for read temperature data, then data persistence is ensured, but system cost increases
Solution Approach 1:
The storage device maintains read temperature information in its own memory structures without requiring external power-fail safety mechanisms. The processing system continuously updates read temperature data based on current read operations, ensuring the information is always current and eliminating the need for battery backup or other persistent power implementations.
3Reliability
If host processors generate and synchronize read temperature maps in High Availability systems, then read temperature tracking is provided, but system complexity increases
Solution Approach 1:
Each storage device independently determines its own read temperature information without requiring coordination with host processors or other storage devices. This eliminates the complexity of map generation and synchronization that would be required in High Availability configurations, while still providing accurate read temperature data for load balancing and data placement decisions.
4Measurement precision
If conventional systems use host memory for read temperature tracking, then read access monitoring is enabled, but dedicated host memory requirements increase cost
Solution Approach 1:
The storage device uses its own processing system and memory resources to track read access patterns and determine read temperature information. By utilizing the storage device's inherent capabilities to monitor its own read operations and analyze error correction information, the solution eliminates the need for dedicated host memory while maintaining precise read access tracking.
Data Source
AI summary
A read disturb information determination system includes a storage device coupled to a global read temperature identification system. The storage device reads, from a first row in a storage subsystem in the storage device, data stored in bits that were previously identified as being susceptible to read disturb effects, and error correction information associated with the data. The storage device uses the error correction information to identify a number of the bits that store portions of the data with errors and, based on the number of bits that store portions of the data with errors, determines read disturb information for the first row in the storage subsystem in the storage device. The storage device then uses the read disturb information to generate a read temperature for a second row in the storage subsystem in the storage device, and provides the read temperature to the global read temperature identification system.