Reconfigurable Self-Test Circuit for Adaptive Component Qualification
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Solution Overview
Problem
Current test and qualification procedures for electronic components, especially in automotive applications, fail to adapt quickly to changing environmental and operational conditions, limiting their reliability and feasibility in harsh environments.
Innovation Solution
An electronic component design featuring a first sub-circuit with fixed-hardware functionality and a reconfigurable second sub-circuit that acts as an interface and testing unit, allowing for dynamic testing and adaptation throughout the component's lifetime, including substitution and extension of functionalities, and energy management.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If traditional test and qualification procedures are used, then manufacturing simplicity is maintained, but adaptability to changing environmental and operational conditions deteriorates
Solution Approach 1:
The test circuit is designed to perform multiple functions: it can execute different test programs, adapt to various environmental conditions, and test different aspects of the electronic component. This multi-functionality allows a single test circuit to replace multiple specialized test systems, improving adaptability without proportionally increasing complexity
Solution Approach 2:
The test circuit incorporates reconfigurable logic elements that can be dynamically programmed and reconfigured during operation. This dynamic capability enables the test system to adapt to changing environmental and operational conditions, transitioning from static traditional testing to adaptive continuous testing
2Reliability
If additional redundancy is added to mitigate risks, then reliability is improved, but device complexity increases
Solution Approach 1:
The electronic component includes integrated self-test functionality where the component tests itself through the embedded reconfigurable test circuit. This self-service approach eliminates the need for external complex testing infrastructure and additional redundancy systems, achieving reliability through self-verification rather than external oversight
Solution Approach 2:
The test circuit continuously monitors the electronic component's operation and provides feedback on its functional status. This real-time feedback mechanism enables early detection of failures and adaptive response, improving reliability without requiring complex redundant systems by maintaining awareness of component health
3Adaptability or versatility
If fixed-hardware functionality is used, then manufacturing precision is maintained, but adaptability deteriorates
Solution Approach 1:
The electronic component is segmented into fixed-hardware functional blocks and reconfigurable logic elements. The fixed-hardware portions maintain manufacturing precision and reliability, while the reconfigurable portions provide adaptability. This segmentation allows each part to optimize its strengths without compromising the whole system
Solution Approach 2:
Different portions of the electronic component have different qualities: fixed-hardware sections provide stable, precise functionality with high manufacturing conformance, while reconfigurable sections provide adaptability. This local differentiation of quality allows the system to simultaneously maintain precision where needed and provide flexibility where required
Data Source
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AI summary
The invention relates to an electronic component comprising a first integrated sub-circuit having a defined interface and a defined fixed-hardware functionality, a second, reconfigurable integrated sub-circuit being signal-connected via the interface to the first sub-circuit to exchange signals therewith, and optionally supply energy thereto, and one or more terminals for electrically connecting the electronic component to its periphery. The second sub-circuit is configured as an interface circuit between the one or more terminals and the first sub-circuit. The second sub-circuit is further configured as a reconfigurable integrated testing unit to test said hardware functionality of the first sub-circuit by applying one or more input signals to the first circuit and evaluating one or more output signals received via the interface from the first sub-circuit in response to the one or more input signals for conformance with one or more predetermined test criteria. The invention is further directed to a system comprising two different components according to various embodiments of the electronic component.