Reduced Height Stacked Die Package via Recessed Bottom Silicon
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Solution Overview
Problem
There is a need to reduce the height of semiconductor packages for mobile electronics to enable the production of thinner devices, as package height is a critical factor in consumer preference and device thickness, particularly in portable electronics like smartphones and wearables.
Innovation Solution
The implementation of reduced height semiconductor packages is achieved through a stacked die package design, where a bottom functional silicon die is thinned by etching a recess and a top component is positioned partially within this recess, maintaining electrical connectivity via micro-bumps and wire bonds or TSVs, allowing for further height reduction without compromising stability.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Length of moving object
If conventional semiconductor package design is used, then structural integrity and electrical functionality are maintained, but package height is too large for thin mobile devices
Solution Approach 1:
The patent embeds the top component within a recess formed in the bottom functional silicon die, creating a nested structure where one component is partially contained within another. This nesting approach reduces the overall package height while maintaining the functional integrity of both components, directly addressing the contradiction between height reduction and structural reliability
Solution Approach 2:
The patent creates a localized recess in the bottom die rather than thinning the entire die structure. This local modification allows height reduction in the critical area where the top component is positioned, while preserving the overall structural integrity and thickness of the bottom die for mechanical strength and electrical functionality
2Length of moving object
If the bottom functional silicon die is thinned to reduce height, then package height decreases, but structural strength and stability are compromised
Solution Approach 1:
The recess is formed only in the specific region where the top component needs to be positioned, rather than thinning the entire bottom die. This localized approach reduces height where necessary while preserving the overall strength and structural integrity of the bottom die for mechanical support and electrical functionality
Solution Approach 2:
The bottom die is thinned partially (only in the recess area) rather than uniformly across the entire die. This partial thinning provides sufficient height reduction to accommodate the top component while maintaining adequate die thickness in other areas to preserve structural strength and stability
3Length of moving object
If a recess is etched into the bottom die to position the top component, then package height is reduced, but manufacturing complexity increases
Solution Approach 1:
The patent modifies the geometric parameters of the bottom die by creating a recess with specific depth and dimensions. This parameter change allows the top component to be positioned within the recess, reducing overall package height. The process uses standard semiconductor fabrication techniques (etching, deposition) to achieve the desired geometry without introducing fundamentally new manufacturing steps
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables the creation of thinner consumer products by reducing the vertical height of semiconductor packages, enhancing device thinness while maintaining structural integrity and electrical functionality, thus addressing the market demand for slimmer mobile electronics.
Implementation Method 1
a recess formed within the bottom functional silicon die by a thinning etch partially reducing a vertical height of the bottom functional silicon die at the recess
Implementation Method 2
maintaining electrical connectivity via micro-bumps and wire bonds or TSVs
Implementation Method 3
maintaining electrical connectivity via micro-bumps and wire bonds or TSVs
Data Source
AI summary
In accordance with disclosed embodiments, there are provided methods, systems, and apparatuses for implementing reduced height semiconductor packages for mobile electronics. For instance, there is disclosed in accordance with one embodiment a stacked die package having therein a bottom functional silicon die; a recess formed within the bottom functional silicon die by a thinning etch partially reducing a vertical height of the bottom functional silicon die at the recess; and a top component positioned at least partially within the recess formed within the bottom functional silicon die. Other related embodiments are disclosed.


