Switching Regulator Fault Detection Circuit Using Delayed Edge Logic
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Solution Overview
Problem
Detecting fault conditions such as short or open conditions in switching voltage regulators is complex and challenging, particularly in automotive applications, which can lead to potentially damaging current and voltage conditions in downstream circuitry.
Innovation Solution
A fault detection circuit using low voltage digital logic components, comprising a first logic gate, a second logic gate, a sequential logic device, and a voltage comparator, with a delay device and digital logic circuit to monitor signals for fault conditions at the switching terminal, differentiating between various fault types without increasing die size or risk of damage.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If complex fault detection methods are used to detect fault conditions in switching voltage regulators, then detection accuracy is improved, but device complexity increases
Solution Approach 1:
The fault detection circuit is segmented into distinct functional modules: a voltage comparator for voltage comparison, digital logic circuitry for signal processing, and a delay device for timing control. Each module performs a specific function, making the overall complex detection task manageable and implementable with standard components while maintaining high detection accuracy.
Solution Approach 2:
The delay device generates a delayed copy of the test signal in advance, creating a time window for fault detection before the main signal progresses. This preliminary action establishes the detection timeline beforehand, allowing the digital logic circuitry to systematically compare signals and detect faults without requiring complex real-time processing.
2Reliability
If comprehensive fault detection is implemented to detect all fault conditions, then reliability is improved, but die area increases
Solution Approach 1:
The fault detection circuit uses universal low-voltage digital logic components that can detect multiple fault conditions (short circuits, open circuits, and other abnormalities) through a single integrated architecture. The voltage comparator and digital logic circuitry work together to universally detect various fault types without requiring separate dedicated circuits for each fault condition, thereby maintaining high reliability while minimizing die area.
Solution Approach 2:
The delay device creates a copied version of the test signal with a time delay, allowing the original and copied signals to be compared by the digital logic circuitry. This copying mechanism enables comprehensive fault detection through signal comparison without requiring additional physical test structures or increasing die area significantly.
3Power
If high voltage components are used to handle high voltage and current, then power handling capability is improved, but cost increases
Solution Approach 1:
The fault detection circuit acts as an intermediary monitoring system that uses low-voltage digital logic components to detect faults in high-voltage switching regulators. Instead of using expensive high-voltage components for detection, the circuit safely interfaces with the high-voltage system through controlled measurement points, enabling fault detection while keeping the detection electronics themselves low-cost and low-voltage.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Effectively detects short or open conditions in switching voltage regulators, providing protection for circuit components while maintaining low cost and minimal die area, enabling early detection of faults to prevent damage.
Implementation Method 1
a voltage comparator having first and second comparator input terminals and a comparator output terminal, the first comparator input terminal coupled to a voltage terminal, the second comparator input terminal coupled to a reference voltage terminal
Implementation Method 2
a delay device coupled between the test signal terminal and a second input terminal of the second logic gate, and a digital logic circuit coupled to an output terminal of the first logic gate
Data Source
AI summary
Fault detection circuits and methods. An example of a fault detection circuit includes a comparator configured to compare a voltage at a voltage terminal with a reference voltage, a digital logic circuit coupled to a test terminal and configured to receive, responsive to the voltage at the voltage terminal being less than the reference voltage as indicated by the comparator, a test signal, the digital logic circuit including at least one digital logic gate, and an edge detection circuit configured to (a) monitor a signal produced at an output of the at least one digital logic gate, and (b) based on the signal failing to transgress a threshold within a time period, providing a fault signal indicating detection of a fault at the test terminal.