Resistive Memory Refresh via Recovery Pulse and Data Re-write

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Solution Overview

Problem

Resistive memory devices face data integrity issues due to the drift phenomenon, which causes resistance values to change over time, necessitating effective refresh operations to maintain stored data.

Innovation Solution

A method involving a first refresh operation with sequential application of a recovery pulse to resistive memory cells, followed by a second refresh operation that re-writes data in each cell, utilizing a resistive memory element and a selection element like an Ovonic Threshold Switch (OTS), with specific voltage levels and operational cycles to stabilize data.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a conventional refresh operation is performed on resistive memory cells, then data integrity is maintained, but power consumption increases and operation time is extended

Engineering Contradiction:
Improvedata integrityVSAvoidpower consumption
Core Design Contradiction:
ReliabilityVSUse of energy by moving object

Solution Approach 1:

The refresh operation is segmented into two distinct types: a first refresh operation that applies a recovery pulse to restore resistance values, and a second refresh operation that performs read-verify-write to correct drift errors. This segmentation allows the system to use the low-power first refresh operation for routine maintenance and only invoke the higher-power second refresh operation when actually needed, thereby reducing overall power consumption while maintaining data integrity.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent changes the operational parameters of the refresh operation by applying a recovery pulse with a specific voltage level (higher than the read voltage but lower than the write voltage) to restore resistance values without fully rewriting data. This parameter optimization allows effective refresh with reduced power consumption compared to conventional full read-verify-write operations.

Inventive Principle:
Principle #35Parameter changes

2Reliability

If a conventional refresh operation is performed on resistive memory cells, then data integrity is maintained, but operation time is extended

Engineering Contradiction:
Improvedata integrityVSAvoidoperation time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The refresh operation is segmented into two distinct types: a first refresh operation that applies a recovery pulse to restore resistance values, and a second refresh operation that performs read-verify-write to correct drift errors. This segmentation allows the system to use the fast first refresh operation for routine maintenance and only invoke the slower second refresh operation when actually needed, thereby reducing overall operation time while maintaining data integrity.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent implements periodic first refresh operations at predetermined intervals to restore resistance values before significant drift occurs. This periodic maintenance approach prevents the accumulation of drift errors, reducing the need for time-consuming second refresh operations and overall extending the time between comprehensive refresh cycles.

Inventive Principle:
Principle #19Periodic action

3Stability of the object's composition

If resistance values are restored by applying voltage to memory cells, then data stability is improved, but performance degradation occurs due to excessive current

Engineering Contradiction:
Improvedata stabilityVSAvoiddevice performance
Core Design Contradiction:
Stability of the object's compositionVSReliability

Solution Approach 1:

The patent optimizes the voltage level of the recovery pulse to be higher than the read voltage (which would turn on the memory cells) but lower than the write voltage (which would change the resistance values). This precise parameter control allows the recovery pulse to restore drift-induced resistance changes and stabilize data without applying excessive current that would cause performance degradation or unintended data changes.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent replaces the conventional mechanical approach of applying high current to restore resistance values with a more refined electrical approach using a recovery pulse of specifically controlled voltage level. This substitution allows effective restoration of resistance values while avoiding the harmful effects of excessive current, thereby maintaining device performance.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach effectively stabilizes data in resistive memory devices by combining a low-current recovery pulse operation with data re-write operations, enhancing data integrity and reducing power consumption while preventing performance degradation.

Implementation Method 1

a resistive memory element M and a selection element S... a recovery pulse of a voltage level higher than a read voltage level but lower than a write voltage level is applied to both ends of the selected memory cell

Methodology Applied
Scientific EffectResistive switching: Electrical Resistance

Implementation Method 2

the selection device may be an Ovonic Threshold Switch (OTS)

Methodology Applied
Scientific EffectThreshold switching: Diode

Data Source

PatentUS20170358350A1Memory device, operation method of the same, and operation method of memory controller
Publication Date: 2017.12.14 SK HYNIX INC
  • US20170358350A1 patent drawing
  • US20170358350A1 patent drawing
  • US20170358350A1 patent drawing

AI summary

A method for operating a memory device comprising a plurality of memory cells, the method may include: performing a first refresh operation comprising sequentially applying a recovery pulse to each of the plurality of memory cells and repeating the sequential application of the recovery pulse to each of the plurality of memory cells for a predetermined number of times; and performing a second refresh operation comprising sequentially re-writing data of each of the plurality of memory cells once after the first refresh operation is performed for the predetermined number of times.