Resistive Memory Voltage Regulator Circuit for Multiplexer Control

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Solution Overview

Problem

Existing resistive memory technologies face challenges in optimizing write currents across temperature, process, and voltage variations, which can lead to ineffective data storage or damage to resistive storage elements.

Innovation Solution

A voltage regulator circuit with a replica resistive storage element is used to provide regulated voltages to multiplexers, ensuring proper write currents are maintained across variations, reducing the number of transistors and optimizing write operations for resistive memory cells.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If write current is increased to ensure effective data storage, then data storage reliability is improved, but risk of damage to resistive storage elements increases

Engineering Contradiction:
Improvedata storage reliabilityVSAvoiddamage to resistive storage elements
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The patent applies parameter changes by dynamically adjusting the write current magnitude based on detected resistance values of the storage element. The system measures the resistance state and modifies the write current parameters accordingly - using higher currents for high-resistance states and lower currents for low-resistance states - thereby achieving reliable data storage while preventing damage to the storage elements.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent implements feedback mechanisms where the resistance value of the storage element is continuously monitored during write operations. This feedback information is used to adjust the write current in real-time, ensuring that the current magnitude is optimized for the current state of the storage element, thus achieving both reliable storage and damage prevention.

Inventive Principle:
Principle #23Feedback

2Reliability

If write current is optimized across temperature and process variations, then data storage reliability is improved, but device complexity increases

Engineering Contradiction:
Improvedata storage reliabilityVSAvoidcircuit complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent applies self-service principles by implementing circuits that automatically detect and compensate for temperature and process variations without requiring external intervention or complex control systems. The storage element's own resistance characteristics are used to determine the appropriate write current, enabling the system to self-adjust to environmental conditions and maintain reliability while minimizing additional circuit complexity.

Inventive Principle:
Principle #25Self-service

3Manufacturing precision

If regulated voltage is provided to multiplexer transistors, then write current control is improved, but manufacturing complexity increases

Engineering Contradiction:
Improvewrite current control precisionVSAvoidmanufacturing complexity
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The patent merges the voltage regulation function with the existing multiplexer transistor structure by providing regulated voltage directly to the multiplexer transistors that control the write current paths. This integration approach combines multiple functions into existing circuit elements, achieving precise write current control while avoiding the need for separate, complex voltage regulation circuits that would increase manufacturing complexity.

Inventive Principle:
Principle #5Merging (Combining)

Data Source

PatentUS11250898B2Non-volatile memory with multiplexer transistor regulator circuit
Publication Date: 2022.02.15 NXP USA INC
  • US11250898B2 patent drawing
  • US11250898B2 patent drawing
  • US11250898B2 patent drawing

AI summary

As disclosed herein, a memory includes an array of resistive memory cells and a voltage regulator circuit that provides a regulated voltage based on a circuit with a replica resistive storage element. The regulated voltage is applied to a mux transistor of a multiplexer of a column decoder that is used to select a particular column line of a memory array from a set of column lines to provide the proper voltage to the memory cell during a write operation to the memory cell.