Resistor Trimming Circuit for High-Frequency Tolerance Control

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Solution Overview

Problem

The increasing demand for high-frequency signal processing in electronic circuits requires precise manufacturing of resistor structures with tight impedance tolerances, which becomes challenging due to the need for smaller components.

Innovation Solution

A method of manufacturing electric circuits that involves providing a substrate with a signal conductor and a resistor structure, using an additional contacting structure for precise measurement and trimming of the resistor structure until it meets predefined nominal values or tolerances.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Speed

If resistor structures are made smaller to handle higher frequencies, then the circuit can process higher frequency signals, but manufacturing precision becomes more difficult to achieve

Engineering Contradiction:
Improvesignal frequencyVSAvoidresistor tolerance
Core Design Contradiction:
SpeedVSManufacturing precision

Solution Approach 1:

The patent applies preliminary action by providing an additional contacting structure that enables preliminary measurement of the resistor structure's characteristics before final assembly. This allows the resistor to be tested and trimmed while accessible, ensuring manufacturing precision is achieved before the component is integrated into the final high-frequency circuit where it would be inaccessible for further adjustment.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent implements self-service by enabling the resistor structure to be measured and trimmed in-situ during the manufacturing process. The additional contacting structure allows the resistor to serve its own measurement and adjustment needs without requiring external intervention or disassembly, facilitating precise trimming to meet tight tolerance requirements even for miniaturized high-frequency components.

Inventive Principle:
Principle #25Self-service

2Length of moving object

If resistor structures are made smaller for high-frequency processing, then physical constraints are satisfied, but measurement and trimming become more difficult

Engineering Contradiction:
Improveresistor sizeVSAvoidmeasurement reliability
Core Design Contradiction:
Length of moving objectVSDifficulty of detecting and measuring

Solution Approach 1:

The patent introduces an intermediary element - the additional contacting structure - that mediates between the small resistor structure and the measurement instruments. This intermediary provides reliable electrical connection points that enable accurate measurement of the miniaturized resistor's characteristics, overcoming the difficulty of measuring and trimming small high-frequency components.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Ease of manufacture

If traditional manufacturing methods are used, then manufacturing process is simple, but tolerance requirements cannot be met

Engineering Contradiction:
Improvemanufacturing process complexityVSAvoidimpedance tolerance
Core Design Contradiction:
Ease of manufactureVSManufacturing precision

Solution Approach 1:

The patent applies segmentation by separating the measurement and trimming functions from the final circuit assembly process. The additional contacting structure creates distinct measurement access points that allow resistor characteristics to be evaluated and adjusted independently during manufacturing, enabling precise tolerance control without complicating the overall manufacturing workflow.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS20250132076A1Signal processing circuit and measurement system
Publication Date: 2025.04.24 ROHDE & SCHWARZ GMBH & CO KG
  • US20250132076A1 patent drawing
  • US20250132076A1 patent drawing
  • US20250132076A1 patent drawing

AI summary

A method of manufacturing an electric circuit includes: providing a signal conductor on a first side of a substrate; providing a resistor structure on the first side of the substrate, the resistor structure contacting the signal conductor; providing a first contacting structure on the first side of the substrate, the first contacting structure electrically connected to the resistor structure by a first electric connection, the first electric connection at least partially provided on the second side of the substrate; applying a test signal to the resistor structure via a measurement circuit contacting the first contacting structure and the signal conductor; determining at least one characteristic property of the first resistor structure based on the test signal; and trimming the resistor structure until the at least one characteristic property has a predefined nominal value or is less than a predefined nominal value by less than a predefined threshold.