3D Island Integration for RF Circuit Miniaturization

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Solution Overview

Problem

Current technologies face challenges in integrating three-dimensional islands for radio frequency (RF) circuits on a single substrate, which limits the miniaturization and performance of RF components such as filters and power amplifiers.

Innovation Solution

The method involves creating a donor wafer assembly with a resonator layer coupled to a substrate, using a weak adhesive layer and low-temperature oxide layer, and transferring RF MEMS resonators to an RF wafer using 3D island printing, enabling epitaxial deposition and improved material properties, and allowing for precise placement and trimming of resonators.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Length of moving object

If traditional integration methods are used for RF circuits on a single substrate, then manufacturing simplicity is maintained, but device miniaturization and performance are limited

Engineering Contradiction:
Improvedevice sizeVSAvoidintegration complexity
Core Design Contradiction:
Length of moving objectVSDevice complexity

Solution Approach 1:

The patent segments the RF circuit integration into distinct three-dimensional islands (separate functional blocks) that are fabricated independently and then integrated together. This allows each island to be optimized and miniaturized separately while maintaining manufacturing simplicity through standardized integration processes.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent transitions from traditional two-dimensional planar integration to three-dimensional vertical stacking of islands. By utilizing the vertical dimension, the device achieves miniaturization in the horizontal plane while maintaining functional performance through multi-layer stacking and vertical interconnects.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Productivity

If three-dimensional islands are integrated for RF circuits, then miniaturization and performance are improved, but manufacturing complexity increases

Engineering Contradiction:
Improveintegration efficiencyVSAvoidfabrication difficulty
Core Design Contradiction:
ProductivityVSEase of manufacture

Solution Approach 1:

The patent applies preliminary action by pre-fabricating and optimizing individual three-dimensional islands separately before integration. This allows each island to be manufactured with high efficiency and performance optimization, then integrated using standardized processes that maintain overall manufacturing efficiency.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent utilizes parameter changes in the integration process, including controlled temperature variations and material property modifications, to enable seamless integration of three-dimensional islands while maintaining manufacturing efficiency and reducing process complexity.

Inventive Principle:
Principle #35Parameter changes

3Manufacturing precision

If epitaxial deposition is used, then material properties and uniformity are enhanced, but process complexity increases

Engineering Contradiction:
Improvematerial uniformityVSAvoidprocess complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent applies epitaxial deposition locally to specific regions where high material uniformity and precision are critical, rather than throughout the entire device. This targeted approach enhances material properties in key areas while minimizing overall process complexity and maintaining manufacturing efficiency in other regions.

Inventive Principle:
Principle #3Local quality

Data Source

PatentUS10790332B2Techniques for integrating three-dimensional islands for radio frequency (RF) circuits
Publication Date: 2020.09.29 INTEL CORP
  • US10790332B2 patent drawing
  • US10790332B2 patent drawing
  • US10790332B2 patent drawing

AI summary

Techniques to fabricate an RF filter using 3 dimensional island integration are described. A donor wafer assembly may have a substrate with a first and second side. A first side of a resonator layer, which may include a plurality of resonator circuits, may be coupled to the first side of the substrate. A weak adhesive layer may be coupled to the second side of the resonator layer, followed by a low-temperature oxide layer and a carrier wafer. A cavity in the first side of the resonator layer may expose an electrode of the first resonator circuit. An RF assembly may have an RF wafer having a first and a second side, where the first side may have an oxide mesa coupled to an oxide layer. A first resonator circuit may be then coupled to the oxide mesa of the first side of the RF wafer.