RF BIST IC Self-Testing via Wireless Signal Exchange
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Solution Overview
Problem
The increasing complexity of testing integrated RF circuits in semiconductor devices leads to high costs and long test times due to the need for expensive automatic test equipment, necessitating an effective RF built-in self-test (BIST) technique.
Innovation Solution
An integrated circuit (IC) with a test signal generator, transmitter, and test result analyzer that communicates with external test equipment using RF signals to perform self-testing, reducing the reliance on external equipment for test pattern generation and result analysis.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If traditional automatic test equipment is used for RF circuit testing, then measurement precision and reliability are improved, but device complexity and cost increase
Solution Approach 1:
The IC performs self-testing by generating its own test signals internally and analyzing its own test results, eliminating the need for external test equipment to generate RF test patterns. The test signal generator creates test signals that are processed through the RF circuit under test, and the test result analyzer evaluates the outputs, allowing the device to test itself autonomously.
Solution Approach 2:
The patent extracts the test signal generation and result analysis functions from the external automatic test equipment and relocates them into the IC itself. This separation removes the burden of complex external RF test equipment while maintaining testing capability through integrated functions.
2Measurement precision
If traditional automatic test equipment is used for RF circuit testing, then measurement precision is improved, but cost increases
Solution Approach 1:
The IC autonomously generates test signals and analyzes test results, eliminating the need for expensive external RF test equipment. This self-service approach significantly reduces manufacturing and testing costs while maintaining adequate measurement precision for defect identification.
Solution Approach 2:
The patent replaces expensive, complex external test equipment with a simpler, more cost-effective integrated testing solution. The internal test signal generator and result analyzer provide sufficient precision for production testing at a fraction of the cost of traditional RF test equipment.
3Measurement precision
If traditional automatic test equipment is used for RF circuit testing, then test accuracy is improved, but test time increases
Solution Approach 1:
The IC performs testing autonomously without requiring setup and configuration of external test equipment for each device. The self-contained testing approach eliminates equipment reconfiguration time and enables faster test execution, improving productivity while maintaining accuracy through integrated signal generation and analysis.
Solution Approach 2:
The test signal generator and result analyzer are pre-integrated into the IC design, so testing can begin immediately without external equipment setup. This preliminary integration of testing functions eliminates preparation time and accelerates the testing process for production environments.
Data Source
AI summary
An IC, a circuitry, and an RF BIST system are provided. The RF BIST system includes a test equipment, a module circuitry, and an IC. The IC is arranged to communicate with the module circuitry by an RF signal in response to a command signal from the test equipment, determine a test result by the RF signal, and report the test result to the test equipment, wherein the module circuitry is external to the IC and the test equipment.