Azimuthal RF Current Sensor Array for Plasma Chamber Uniformity

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Solution Overview

Problem

Modern plasma processing chambers face challenges in achieving azimuthal uniformity due to non-symmetric components such as cantilever arms and uneven gas flow, which affect RF current return paths and plasma density, leading to non-uniform processing around the substrate.

Innovation Solution

The implementation of RF current sensors positioned azimuthally around the chamber to monitor and measure RF return currents, using RF ground straps and trench machined components to improve RF ground return uniformity and characterize azimuthal non-uniformity, allowing for strategic adjustments to achieve uniform processing.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If non-symmetric components such as cantilever arms are used in the plasma processing chamber, then device integration density is improved, but azimuthal uniformity deteriorates

Engineering Contradiction:
Improvedevice integration densityVSAvoidazimuthal uniformity
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The patent modifies the physical state and distribution parameters of the plasma by introducing controlled azimuthal non-uniformity through non-symmetric components. By changing parameters such as gas flow distribution, RF power distribution, and plasma density profiles, the system achieves both high device integration density and acceptable azimuthal uniformity through parameter optimization rather than geometric symmetry.

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If RF current sensors are positioned azimuthally around the chamber, then measurement precision of azimuthal non-uniformity is improved, but device complexity increases

Engineering Contradiction:
Improveazimuthal non-uniformity monitoringVSAvoidsensor positioning and configuration
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The RF current sensors are designed to serve multiple functions: they measure RF return current magnitude, detect azimuthal non-uniformity patterns, and provide diagnostic information for process optimization. This multi-functionality reduces the need for separate measurement systems and justifies the added complexity by delivering comprehensive chamber characterization through a single sensor type.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Productivity

If exhaust gas flows around the cantilever arm, then pumping efficiency is maintained, but pressure uniformity in the azimuthal direction deteriorates

Engineering Contradiction:
Improvepumping efficiencyVSAvoidpressure uniformity
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The patent applies different gas flow characteristics to different azimuthal regions of the chamber. By allowing exhaust gas to flow around the cantilever arm in specific regions while maintaining different flow patterns in other regions, the system creates locally optimized flow fields that preserve pumping efficiency while managing pressure uniformity through regional differentiation rather than global uniformity.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution enables precise monitoring and adjustment of RF return currents, ensuring improved azimuthal uniformity and process consistency, meeting stringent modern processing requirements by allowing for real-time monitoring and adaptive strategies to address non-uniformity.

Implementation Method 1

RF current sensors positioned azimuthally around the chamber to monitor and measure RF return currents

Methodology Applied
Scientific EffectElectrical Conduction: Conduction (electrical)

Data Source

PatentUS9245720B2Methods and apparatus for detecting azimuthal non-uniformity in a plasma processing system
Publication Date: 2016.01.26 LAM RES CORP
  • US9245720B2 patent drawing
  • US9245720B2 patent drawing
  • US9245720B2 patent drawing

AI summary

Apparatus and methods for assessing RF return current azimuthal uniformity are disclosed. A plurality of non-linear substantially-enclosed RF current sensors are disposed azimuthally around a central axis of a plasma processing chamber. When a plasma is ignited in the plasma processing chamber, the RF return currents are sensed in the plurality of non-linear substantially-enclosed RF current sensors and analyzed to ascertain whether RF return current azimuthal uniformity is acceptable.