RF Emission Analysis for Irradiated Electronic Device Condition Assessment
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Solution Overview
Problem
Existing technologies lack an effective method to assess the condition and survivability of electronic devices exposed to radiation, particularly in assessing the degradation caused by irradiation stress.
Innovation Solution
The method involves using RF emissions in the radio frequency range to assess the condition of electronic devices subjected to radiation. This is achieved by analyzing the emissions before and after exposure to radiation, using a test fixture that energizes the device with a power and clock signal, and employing signal processing techniques to identify changes in the emission signature.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional functional testing methods are used to assess irradiated electronic devices, then the assessment can be performed, but the process is time-consuming and costly
Solution Approach 1:
The patent replaces traditional mechanical/electrical functional testing methods with electromagnetic field-based detection. By measuring unintended RF emissions from the device under test, the system assesses device condition without requiring functional operation or complex test equipment, thereby reducing both time and cost while maintaining assessment accuracy
Solution Approach 2:
The patent introduces an intermediary measurement approach by detecting RF emissions as a proxy for device health status. Instead of directly testing device functionality, the system measures the electromagnetic emissions that naturally occur during device operation, using these emissions as an indirect indicator of device condition and degradation
2Reliability
If comprehensive functional testing is performed on irradiated devices, then device condition can be assessed, but the complexity and cost of testing increases
Solution Approach 1:
The patent extracts the essential diagnostic information from complex functional testing by isolating and measuring only the unintended RF emissions. This extraction approach separates the critical health indicators from the unnecessary complexity of comprehensive functional testing, achieving reliable assessment with simplified methodology
Solution Approach 2:
The patent employs a simple,低成本 detection system that measures RF emissions without requiring expensive, complex test equipment. The method uses off-the-shelf RF receivers and signal processing to achieve reliable device assessment, replacing costly specialized testing systems with simpler, more economical alternatives
3Measurement precision
If traditional methods are used to determine remaining useful life of irradiated devices, then survival probability can be estimated, but the process lacks accuracy and efficiency
Solution Approach 1:
The patent replaces traditional accelerated life testing and functional degradation analysis with electromagnetic emission-based monitoring. By tracking changes in RF emission characteristics over time and across different radiation doses, the system efficiently determines remaining useful life and survival probability without time-consuming functional testing cycles
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This method allows for the accurate assessment of the functional degradation and remaining useful life of electronic devices exposed to radiation, providing a cost-effective and time-efficient approach to determining the effects of radiation on electronic components.
Implementation Method 1
measuring a first value of a parameter of the electrical device in a first emission of an electromagnetic energy in a radio frequency (RF) spectrum emitted from the energized electrical device
Implementation Method 2
the electrical device has been exposed to a stress that degrades a functionality of the electrical device
Data Source
AI summary
A method includes the steps of energizing, in a test fixture with a combination of a power signal and a clock signal, an electrical device selected from a plurality of electrical devices, measuring a first value of a parameter of the electrical device in a first emission of an electromagnetic energy in a radio frequency (RF) spectrum emitted from energized electrical device, irradiating the electrical device, irradiating the electrical device with a radiation dose in a radiation type, measuring a second value of the parameter in the second emission of the electromagnetic energy in the RF spectrum emitted from the energized and irradiated electrical device, measuring a difference between the first value and the second value, and determining a condition of the electrical device based on a measured difference.