Contactless Circuit Testing TRIZ Cases
- Electrical Connecting Apparatus Guide Mechanism for Accurate IC Contact
Segmented guides isolate vibration from the positioning reference, preventing device displacement and maintaining measurement precision during testing.
- Semiconductor Inspection Device Electron Beam Absorption Current Sensitivity
A semiconductor inspection device uses an electron optical system and measurement probe to acquire electrical characteristic maps.
- Wireless IC Loopback Testing on Undiced Wafers
Transmitter and receiver circuitry exchange signals through a transmission line to perform loopback testing.
- Opposite-Side Probe Wireless Signal Measurement System
Opposite-side probes measure wireless and electrical signals simultaneously, eliminating sequential testing delays.