RF Sputtering Substrate Bias via Impedance Matching

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Solution Overview

Problem

Radio frequency sputtering physical vapor deposition methods face challenges in controlling the properties of deposited thin films, particularly in achieving desired piezoelectric and dielectric properties.

Innovation Solution

A method involving an impedance matching network with an inductor in series with a capacitor is used to connect a chuck to ground, generating a self-bias DC voltage on the substrate, allowing for the deposition of thin films with controlled properties, such as PZT films with specific dielectric constants and crystalline structures.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If conventional RF sputtering is used without impedance matching network, then the deposition process is simple, but the properties of deposited thin films cannot be controlled

Engineering Contradiction:
Improvecontrol of thin film propertiesVSAvoidcomplexity of deposition apparatus
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

An impedance matching network is introduced as an intermediary component between the RF power source and the substrate chuck. This network, comprising an inductor and capacitor, mediates the RF signal to generate a self-bias DC voltage on the substrate, thereby enabling control of thin film properties without directly complicating the core deposition process

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The impedance matching network changes the electrical parameters of the system by transforming the RF signal into a self-bias DC voltage. By adjusting the capacitance and inductance values in the network, the DC voltage on the substrate can be controlled, which in turn controls the properties of the deposited thin film

Inventive Principle:
Principle #35Parameter changes

2Reliability

If impedance matching network is added to control thin film properties, then piezoelectric and dielectric properties are improved, but the apparatus complexity increases

Engineering Contradiction:
Improvepiezoelectric and dielectric propertiesVSAvoidcomplexity of impedance matching network
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The impedance matching network serves as a mediator that indirectly controls the substrate conditions through self-bias voltage generation. This approach improves film reliability by controlling deposition conditions without requiring direct complex control systems on the substrate holder

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The impedance matching network automatically generates the self-bias DC voltage through the interaction of RF signal with the inductor and capacitor components. This self-service mechanism eliminates the need for additional active control components or power supplies on the substrate side, reducing overall system complexity while maintaining improved film properties

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables the formation of thin films with advantageous piezoelectric and dielectric properties, including high dielectric constants and break-down voltages, by controlling the self-bias DC voltage, which is essential for applications like MEMS devices.

Implementation Method 1

When the RF power is initiated, a plasma is formed. Positive gas ions are pulled to the target surface, strike the target, and remove target atoms by momentum transfer.

Methodology Applied
Scientific EffectPlasma: Plasma

Implementation Method 2

Radio frequency sputtering PVD is a method for depositing a thin film on a substrate. The substrate is placed in a vacuum chamber facing a target that is connected to an RF power supply. When the RF power is initiated, a plasma is formed. Positive gas ions are pulled to the target surface, strike the target, and remove target atoms by momentum transfer.

Methodology Applied
Scientific EffectSputtering: Sputtering

Implementation Method 3

Radio frequency sputtering PVD is a method for depositing a thin film on a substrate. The substrate is placed in a vacuum chamber facing a target that is connected to an RF power supply. The removed target atoms then deposit on the substrate to form a thin film layer.

Methodology Applied
Scientific EffectPhysical vapor deposition: Physical Vapour Deposition

Implementation Method 4

electrically connecting a chuck in the physical vapor deposition apparatus to ground through an impedance matching network, wherein the chuck supports a substrate, and wherein the impedance matching network consists of an inductor in series with a capacitor

Methodology Applied
Scientific EffectElectrical impedance matching:

Data Source

PatentEP2660351B1Radio frequency tuned substrate biased physical vapor deposition apparatus and method of operation
Publication Date: 2015.01.28 FUJIFILM CORP
  • EP2660351B1 patent drawingFigure 1
  • EP2660351B1 patent drawingFigure 2A~2B
  • EP2660351B1 patent drawingFigure 3

AI summary

A method of physical vapor deposition includes applying a radio frequency signal to a cathode in a physical vapor deposition apparatus, wherein the cathode includes a sputtering target, electrically connecting a chuck in the physical vapor deposition apparatus to an impedance matching network, wherein the chuck supports a substrate, and wherein the impedance matching network includes at least one capacitor, and depositing material from the sputtering target onto the substrate.