Ring Test Structure for Propagation Delay Dispersion Measurement
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Manufacturing of electronic components often results in variations in characteristic values, such as propagation delay, which are difficult to quantify using existing methods that require extensive calculations or additional components, making it challenging to determine dispersion effectively.
Innovation Solution
A device and method that utilize a test structure with stages of components configured in a ring, including comparators and multiplexers, to calculate the dispersion of propagation delay by measuring the difference between longest and shortest propagation delays across pairs of component assemblies, using a formula that simplifies calculations and reduces component requirements.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If existing methods are used to determine dispersion, then measurement precision may be maintained, but device complexity and computational requirements increase significantly
Solution Approach 1:
The test structure is segmented into multiple identical stages, each containing two assemblies of components. This segmentation allows the dispersion determination to be performed through repeated measurements across stages rather than through complex calculations, simplifying the overall device architecture while maintaining measurement precision.
Solution Approach 2:
Instead of measuring all possible propagation delays and performing exhaustive calculations, the method uses a selective approach by measuring only the longest and shortest propagation delays in each pair of assemblies. This partial measurement approach reduces computational complexity while still providing accurate dispersion characterization.
2Measurement precision
If comprehensive measurements are performed to accurately determine dispersion, then measurement precision improves, but loss of time increases due to extensive calculations
Solution Approach 1:
The method performs only the necessary measurements (longest and shortest propagation delays per pair) rather than comprehensive measurements of all possible paths. This selective measurement approach maintains measurement precision while dramatically reducing the time required for data processing and calculation.
Solution Approach 2:
The test structure is designed with pre-configured pairs of assemblies and integrated calculation logic that performs dispersion determination during the measurement process itself, rather than requiring separate post-processing calculations. This preliminary structuring of the measurement approach eliminates time-consuming computational steps.
3Measurement precision
If additional components are added to enable dispersion determination, then measurement capability improves, but manufacturing costs and device complexity increase
Solution Approach 1:
The test structure uses universal, identical stages that can be repeatedly instantiated. Each stage contains the same components (assemblies, comparators, multiplexers) that serve multiple functions: testing both assemblies within the stage and contributing to the overall dispersion measurement across all stages. This multi-functionality reduces the variety of components needed and simplifies manufacturing.
Solution Approach 2:
Instead of designing unique test circuits for each measurement, the invention uses multiple copies of identical test stages. Each stage is a copy of the same structure with two assemblies, allowing the system to determine dispersion through replication rather than through complex, custom-designed circuits. This copying approach significantly reduces manufacturing complexity and cost.
Data Source
AI summary
A value representative of a dispersion of a propagation delay of assemblies of electronic components is determined. A component test structure includes stages of components and a logic circuit connected in a ring. Each stage includes two assemblies of similar components configured to conduct a signal. A test device is configured to obtain values of the component test structure and to perform operations on these values.