Rotatable Inspection Light Sources for Component Defect Detection
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Solution Overview
Problem
Existing inspection systems for manufactured components often fail to detect defects comprehensively due to static light source orientations, which can miss defects hidden at specific angles, leading to incomplete defect exposure during the inspection process.
Innovation Solution
An inspection system with rotatable fixtures and light sources arranged radially about a base, allowing for adjustable yaw and pitch angles to illuminate manufactured components from a range of angles, ensuring all potential defects are exposed during the inspection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If static light source orientations are used, then the inspection system structure is simple, but defects hidden at specific angles cannot be detected
Solution Approach 1:
The patent applies the dynamics principle by transforming static light sources into dynamically adjustable ones. Each light source is mounted on a fixture with rotatable first and second portions that can change orientation independently about different axes (first axis and second axis), allowing the light direction to be dynamically adjusted to illuminate defects from multiple angles during inspection
Solution Approach 2:
The fixture structure is segmented into multiple independently rotatable portions (first portion and second portion), each capable of rotating about a different axis. This segmentation allows flexible positioning of the light source without requiring complex monolithic mechanisms, resolving the contradiction between detection completeness and structural simplicity
2Reliability
If light sources are fixed at single angles, then the system is easy to operate, but comprehensive defect exposure is achieved
Solution Approach 1:
The system employs dynamic light source positioning where fixtures can be rotated to different angles during operation. The controller coordinates the rotation of multiple light sources to sweep across the workpiece surface, automatically achieving comprehensive defect exposure without requiring manual repositioning by operators
Solution Approach 2:
Each fixture is designed with multi-axis rotation capability, making it universally adaptable for illuminating defects from various angles. The same fixture structure can be positioned at different orientations to detect different types of defects, reducing the need for multiple specialized lighting configurations
Data Source
AI summary
An inspection system includes a base, an array of fixtures, and a plurality of sensors or light sources. Each fixture has a first portion rotatably secured to the base and configured to rotate about a yaw axis and a second portion rotatably secured to the first portion and configured to rotate about a pitch axis. Each sensor or light source is secured to one of the fixtures and is configured to direct light at yaw and pitch angles relative to the base.