Optically Investigating Flaws/Contamination TRIZ Cases
- On-the-fly Container Inspection via Tangential Optical Axis
Tangential optical axis captures container images during transport to detect shape defects without slowing production speed.
- Defect Detection Using Dimensionality Reduction Lighting
Dimensionality reduction identifies optimal lighting combinations, resolving the trade-off between detection accuracy and inspection speed.
- Illumination Unit for Sheet Processing Quality Control
A dual-reflector illumination unit maintains constant brightness across varying sheet thicknesses, ensuring reliable image capture.
- Gas Concentration Measurement Using Dynamic Radiation Path Biasing
A gas measurement method biases deformable container walls between positioning surfaces to define a constant radiation path length.
- Overlay Target Assist Features for Edge Effect Reduction
Metrology tool-driven optical proximity correction assist features reduce measured intensity peaks at grating peripheries.
- Flexible Display Crack Detection Line and Blocking Layers
Multi-layer crack detection lines with blocking layers identify substrate fractures, preventing moisture penetration and dark spots in flexible displays.
- Dark-Field Inspection Apparatus Haze Signal Separation
Inspection apparatus separates haze and defect signals using frequency segmentation to optimize sensitivity settings.
- Coded Light-Sheet Array Microscopy for Fast Volumetric Imaging
A coded light-sheet array microscopy technique enables parallelized illumination and detection using a reconfigurable incoherent light-sheet array.