RRAM Read Stability via Verification Voltage Pulse

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Solution Overview

Problem

RRAMs experience instability and high reading errors due to the wide distribution of reset current values, leading to verification failures, which are exacerbated by the diffusion of oxygen and the effects of tightening and loosening traps during the programming process.

Innovation Solution

The proposed operation method for RRAM involves providing a reset voltage pulse, a dummy voltage pulse, and a verification voltage pulse, with the verification voltage pulse having a higher voltage level than the reading voltage pulse, and incorporating a waiting period between the reset and verification pulses to improve stability and reduce errors.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If a read verification is performed using the same voltage level as the read operation, then the reading process is simple, but the reading stability is poor and verification failures occur frequently

Engineering Contradiction:
Improvereading process complexityVSAvoidreading stability
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The patent applies preliminary action by performing a verification read operation at a higher voltage level before the actual read operation. This preliminary verification ensures that the RRAM cell is properly set and prevents verification failures during the actual read, thereby improving reading stability without significantly increasing overall process complexity.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent changes the voltage parameter by using a verification voltage level that is higher than the normal read voltage level. This parameter change allows for more reliable verification of the RRAM cell state, as the higher voltage provides a stronger signal that is less susceptible to noise and variability, thus improving reading stability.

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If the verification voltage level is increased to improve reading stability, then the reading accuracy improves, but the power consumption increases

Engineering Contradiction:
Improvereading accuracyVSAvoidpower consumption
Core Design Contradiction:
Measurement precisionVSUse of energy by moving object

Solution Approach 1:

The patent applies partial action by using a higher verification voltage only for the verification read operation, not for the actual read operation. This allows achieving better reading accuracy during verification while limiting the power consumption increase to only the verification step, rather than continuously consuming higher power during all read operations.

Inventive Principle:
Principle #16Partial or excessive action

3Reliability

If multiple verification reads are performed to improve reading reliability, then the reading accuracy improves, but the operating time increases

Engineering Contradiction:
Improvereading reliabilityVSAvoidoperating time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent performs the verification read as a preliminary action before the actual read operation. This single preliminary verification is sufficient to ensure reliability, avoiding the need for multiple iterative verification reads and thus minimizing the time penalty while achieving improved reading reliability.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS9659643B2Operation method for RRAM
Publication Date: 2017.05.23 WINBOND ELECTRONICS CORP
  • US9659643B2 patent drawing
  • US9659643B2 patent drawing
  • US9659643B2 patent drawing

AI summary

The present invention provides an operation method for RRAM. The operation method includes providing a reset voltage pulse to a RRAM, providing a dummy voltage pulse to the RRAM, and providing a verification voltage pulse to the RRAM. The reset current of the RRAM is read when the verification voltage pulse is provided. The voltage level of the verification voltage pulse is higher than the voltage level of the read voltage pulse for reading the RRAM.