Sample Collection Device with Weakening Structure for Uniform Drying
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Solution Overview
Problem
Conventional sample collection devices fail to prevent aggregation of suspended particles during the drying process due to surface tension, limiting their suitability for various microscope observations, and existing devices are not easily openable for close proximity inspection by instruments like atomic force microscopes.
Innovation Solution
A sample collection device with two substrates and a spacer, featuring a weakening structure at the periphery, allows for uniform drying and easy opening, maintaining particle distribution and suitability for multiple microscopy techniques by using capillary action to control liquid flow and facilitate close proximity inspection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If conventional techniques are used to prepare a dry sample specimen from a liquid sample specimen, then the sample can be observed by a microscope, but the suspended particles will drift and converge due to surface tension causing non-uniform external force
Solution Approach 1:
The device divides the sample observation space into two separate chambers (first chamber for liquid sample, second chamber for dried sample) connected by a through-hole. This segmentation allows the liquid sample to be transferred and dried in a controlled manner, preventing surface tension from causing particle convergence while maintaining uniform distribution.
Solution Approach 2:
The through-hole structure acts as an intermediary element that connects the liquid sample chamber and the dried sample chamber. It enables controlled liquid flow and pressure equalization during the drying process, preventing harmful surface tension effects while maintaining particle uniformity.
2Reliability
If a dried liquid sample specimen device with upper and lower two substrates is used, then the sample can be dried, but the two substrates cannot be easily opened preventing close distance approach by observation instruments
Solution Approach 1:
The device is segmented into two separable substrates (first substrate and second substrate) that can be easily opened and separated after the drying process. This allows the dried sample to be accessed and observed by instruments requiring close proximity, such as atomic force microscopes, while maintaining effective drying during operation.
3Adaptability or versatility
If a device suitable for electron microscope observation is used, then electron microscope observation can be performed, but it cannot be used for atomic force microscope which requires nanometer range proximity
Solution Approach 1:
The device structure is segmented into separable substrates that can be opened to expose the dried sample surface. This design enables the sample to be accessed at nanometer proximity for atomic force microscopy while maintaining the sealed structure needed for electron microscopy observation, thus achieving versatility across different microscope types.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The device prevents particle aggregation during drying, enabling uniform sample preparation suitable for diverse microscopy techniques, including atomic force microscopy, and allows for broad applicability beyond electron microscopes.
Implementation Method 1
allow a liquid sample to be absorbed into kept in a sample containing space through, for example, by the capillary phenomenon
Data Source
AI summary
A sample collective device includes two substrates and a spacer. Each substrate has a first surface and a second surface, and the two substrates are arranged with the first surfaces facing each other. The spacer is disposed between the two first surfaces for bonding and fixing the two substrates and forming a sample containing space. In addition, each of the substrates includes a first weakening structure located in the periphery of the sample containing space and exposed on the first surface. A sample collective device array including a plurality of the aforementioned sample collective devices is also provided.