Scanning Probe Microscope Curve-Area Measurement for Soft-Sample Hardness
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Solution Overview
Problem
Conventional scanning probe microscopes struggle to accurately measure physical properties of samples, particularly soft samples, as the distance-dependence of forces acting on the probe and sample surface changes, making it difficult to determine adsorbed quantities.
Innovation Solution
A scanning probe microscope equipped with a probe, support member, displacement measurement unit, curve generation unit, and physical quantity calculation unit, which generates and calculates areas between approach and release curves to determine physical quantities such as hardness, regardless of sample hardness, by scanning in the horizontal direction and generating images based on these calculations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional force curve measurement is used, then measurement method is simple, but measurement precision deteriorates for soft samples
Solution Approach 1:
The patent segments the measurement process into two distinct phases: approach curve measurement (when sample approaches probe) and release curve measurement (when sample moves away from probe). By separating these measurements and comparing the areas between the curves, the system can accurately measure physical properties of soft samples that cannot be measured using conventional single-curve methods.
Solution Approach 2:
The patent measures displacement in both the approach and release directions, performing more measurements than the conventional single-direction method. This excessive action of measuring both approaches and releases provides the additional information needed to calculate the area between curves, enabling accurate measurement of soft sample properties.
2Measurement precision
If area between curves calculation is used, then physical quantity measurement accuracy is improved, but calculation complexity increases
Solution Approach 1:
The patent replaces complex force measurements with displacement measurements of the support member. By using a displacement measurement unit to detect support member movement and calculating areas from displacement-time curves, the system achieves accurate physical quantity measurement without requiring complex force sensing mechanisms.
3Adaptability or versatility
If displacement measurement of support member is used, then measurement capability is improved, but system complexity increases
Solution Approach 1:
The patent introduces a support member as an intermediary between the probe and the measurement system. The support member's displacement serves as a measurable quantity that reflects the physical properties of the sample. This intermediary approach enables versatile measurement of various physical quantities while keeping the direct measurement system relatively simple.
Data Source
AI summary
A scanning probe microscope (50) is provided with a probe (20), a cantilever (2) supporting the probe (20), a scanner (43) on which a sample (S) is placed, a drive unit (4) for changing the distance between the sample (S) and the probe (20), and a displacement measurement unit (3) for measuring the displacement of the cantilever (2). The scanning probe microscope (50) is provided with a curve generation unit (11) for generating a first curve representing the relation between the distance between the probe (20) and the sample (S) and the quantity representing the displacement of the cantilever (2) when the sample (S) approaches the probe (20) and a second curve representing the relation between the distance between the probe (20) and the sample (S) when the sample (S) moves away from the probe (20) and the quantity representing the displacement of the cantilever (2), and a physical quantity calculation unit (53) for determining the quantity representing the area between the first curve and the second curve as a physical quantity of the sample.