Nanotechnology TRIZ Cases
- Scanning Probe Microscope Curve-Area Measurement for Soft-Sample Hardness
This case calculates the area between approach and release curves to measure soft-sample hardness and surface shape accurately.
- Stacked Transistors with Isolation and Common Gate for Lower Capacitance
A sacrificial layer defines transistor borders, simplifying inner spacers and gate-metal processing in stacked common-gate devices.
- Pneumatic Switching Device for Stable Nanoparticle Deposition
This case uses pressure-controlled switching and exhaust paths to redirect aerosol flow without interrupting nanoparticle deposition.