Scanning Probe Microscope Dual-Probe Holder for Rapid Switching
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Solution Overview
Problem
Scanning probe microscopy techniques face challenges with probe substance ageing and damage during measurements, leading to decreased specificity and increased time expenditure due to frequent probe replacements and contamination risks.
Innovation Solution
A method where two measuring probes are arranged on a common receptacle, allowing for alternating measurement positions without physical replacement, enabling reduced time and effort in scanning probe microscope examinations by displacing probes between measurement and non-measurement positions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If a single measuring probe is used in scanning probe microscopy, then the device complexity is low, but the productivity decreases due to frequent probe replacements
Solution Approach 1:
The patent combines multiple measuring probes (at least two probes) into a single probe holder assembly that can be simultaneously mounted in the scanning probe microscope. This merging approach allows alternating measurements with different probes without removal, resolving the contradiction by improving productivity through continuous measurement capability while keeping the device complexity manageable through a unified holder design.
Solution Approach 2:
The patent implements a dynamic probe selection system where the microscope can switch between multiple probes mounted in the same holder during measurements. This dynamic capability allows the system to adaptively select appropriate probes for different measurement tasks or sample regions, improving productivity by eliminating probe replacement time while maintaining controlled complexity through software-controlled probe management.
2Measurement precision
If probe replacement is performed frequently, then measurement accuracy is maintained, but the loss of time increases
Solution Approach 1:
The patent enables continuous measurement action by mounting multiple probes in the same holder, allowing the system to switch between probes without removal or reinstallation. This continuity eliminates the time loss associated with frequent probe replacements while maintaining measurement accuracy through selective use of probes based on their condition and suitability for specific measurement tasks.
Solution Approach 2:
The patent prepares multiple probes in advance within the same holder assembly, so that when one probe needs replacement or is unsuitable for a measurement, another pre-positioned probe is immediately available. This preliminary arrangement of multiple probes eliminates the time loss of probe replacement while maintaining measurement precision through pre-selected appropriate probes.
3Reliability
If probe substance is applied to the measuring probe, then specificity of measurement is improved, but the reliability decreases due to ageing and damage
Solution Approach 1:
The patent implements a system where multiple probes with probe substances are mounted in the same holder, allowing the system to discard (switch away from) probes whose substances have aged or damaged and recover (switch to) fresh probes with intact substances. This approach maintains measurement consistency by always using probes with effective substances while extending the overall system's operational duration through multiple probes.
Solution Approach 2:
The patent creates a dynamic probe management system that can switch between multiple probes with different substance states during measurements. This dynamic capability allows the system to adapt to probe substance degradation by selecting probes with optimal substance condition, thereby maintaining measurement reliability while effectively managing the limited lifespan of individual probe substances.
4Object-affected harmful factors
If the measuring probe is removed and replaced, then contamination is prevented, but the ease of operation decreases
Solution Approach 1:
The patent combines multiple probes in a single holder assembly that remains mounted in the microscope, allowing probe substitution without removal of the holder assembly. This merging approach prevents contamination by enabling clean probe swaps within the controlled environment while maintaining ease of operation through a unified holder design that simplifies the replacement procedure.
Solution Approach 2:
The patent uses the probe holder as an intermediary structure that facilitates easy probe replacement. The holder serves as a mediator between the microscope and individual probes, allowing probes to be quickly exchanged without complex handling while maintaining contamination prevention through the controlled replacement process enabled by the holder's design.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach simplifies and accelerates scanning probe microscope examinations by minimizing probe replacement and contamination, maintaining measurement accuracy and reducing the need for frequent probe changes.
Implementation Method 1
a topography of the sample is determined via a distance-dependent interaction between the measuring probe and the sample
Implementation Method 2
This enables to measure forces by detecting the deformation of the measuring probe
Data Source
AI summary
The invention relates to a method and to a device for examining a test sample using a scanning probe microscope. According to the method a first and a second measurement using a scanning probe microscope are carried out on the test sample using a measuring probe system in which a measuring probe and another measuring probe are formed on a common measuring probe receptacle. During the first measurement, in relation to the test sample, the measuring probe is held in a first measurement position and the other measuring probe is held in another non-measurement position, and the test sample is examined with the measuring probe using a scanning probe microscope. After the first measurement, by displacing in relation to the test sample, the measuring probe is displaced from the measurement position into a non-measurement position and the other measuring probe from the other non-measurement position into another measurement position. During the second measurement, in relation to the test sample, the measuring probe is held in the non-measurement position and the other measuring probe is held in the other measurement position, and the test sample is examined with the other measuring probe using a scanning probe microscope. The invention also relates to a measuring sensor system of a scanning probe microscope.