Security Marker Codes Using Particle Size Distribution
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Solution Overview
Problem
Current security marker authentication methods are costly and vulnerable to counterfeiting, as they rely solely on emissive characteristics that can be replicated by counterfeiters, and the detection of low marker levels becomes increasingly accessible with advancing technology.
Innovation Solution
Incorporating emissive particles with distinct size distributions into security markers, which are detected through image-wise analysis of their emission patterns when excited with specific spectral bands, creating a complex and difficult-to-replicate security code.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If security markers rely solely on emissive characteristics for authentication, then the detection method is simple and cost-effective, but the authentication system becomes vulnerable to counterfeiting as emissive characteristics can be replicated
Solution Approach 1:
The patent changes the physical parameter of particle size distribution to create a more secure authentication system. By incorporating particles with different size distributions (e.g., bimodal distribution with peaks at different diameters), the marker's physical characteristics become more complex and difficult to replicate, while maintaining compatibility with existing emissive detection methods
Solution Approach 2:
The patent uses composite marker materials consisting of particles with different size distributions, shapes, and/or compositions within the same marker. This composite approach increases the complexity of the marker code, making it more resistant to counterfeiting while still being detectable by relatively simple emissive detection systems
2Reliability
If security markers are applied at very low levels to objects, then the marker is less detectable and more secure, but the detection of low marker levels becomes increasingly accessible with advancing technology
Solution Approach 1:
The patent applies local quality by creating spatial variations in particle distribution and size within the marker. Different regions of the marker contain particles with different size distributions, creating a unique spatial pattern that is difficult to replicate even at low marker levels. This local variation in particle characteristics enhances security while maintaining detectability
3Ease of manufacture
If conventional authentication methods are used, then the detection system is simple and cost-effective, but the method is vulnerable to counterfeiting and cannot distinguish between genuine and counterfeit markers
Solution Approach 1:
The patent adds another dimension to the authentication code by incorporating particle size distribution as an additional coding parameter beyond just emissive characteristics. This dimensional addition creates a more complex authentication system that requires more sophisticated detection capabilities, improving reliability while maintaining reasonable manufacturing costs
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach provides a cost-effective method for generating a more secure authentication system by distinguishing between particle size distributions, making it harder for counterfeiters to replicate the marker code and reducing the need for expensive detection systems.
Implementation Method 1
when excited with light of appropriate wavelengths, emit radiation which produce a unique image
Implementation Method 2
emissive particles which, when excited with light of appropriate wavelengths, emit radiation
Data Source
AI summary
A security marker material comprising emissive particles selected from at least two groups with different size distributions and the size distributions satisfy the formula:[(x−z)2/(Sx2+Sz2)]1/2>1wherein x and z are the volume-weighted mean equivalent-spherical diameters of the two particle distributions and Sx and Sz are the standard deviations of the same two distributions.