Segmented Semiconductor Laminate for Warpage Control

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Solution Overview

Problem

Large-sized semiconductor light emitting elements face issues with warpage and reduced light extraction efficiency due to thermal expansion coefficient differences and increased light reflection, leading to defective regions and poor yield.

Innovation Solution

The semiconductor laminate is divided into multiple regions by trenches, reducing stress and warpage, and shortening the light's path to emission points, thereby improving light extraction efficiency.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Area of stationary object

If the size of the semiconductor light emitting element is increased, then the light output area is improved, but warpage is more likely to occur due to thermal expansion coefficient differences

Engineering Contradiction:
Improvelight output areaVSAvoidwarpage
Core Design Contradiction:
Area of stationary objectVSStability of the object's composition

Solution Approach 1:

The semiconductor laminate is divided into multiple semiconductor regions (first, second, third regions) with different thickness configurations. The p-type semiconductor layer has different thicknesses in different regions, creating segmentated thickness variations that reduce overall warpage while maintaining large light output area.

Inventive Principle:
Principle #1Segmentation

2Area of stationary object

If the size of the semiconductor light emitting element is increased, then the light output area is improved, but defective regions are more likely to be generated in the semiconductor laminate

Engineering Contradiction:
Improvelight output areaVSAvoiddefective region probability
Core Design Contradiction:
Area of stationary objectVSReliability

Solution Approach 1:

The semiconductor laminate is divided into multiple independent semiconductor regions. This segmentation isolates potential defects to specific regions, preventing a single defect from rendering the entire large-sized element defective, thereby improving overall reliability while maintaining large light output area.

Inventive Principle:
Principle #1Segmentation

3Area of stationary object

If the size of the semiconductor light emitting element is increased, then the light output area is improved, but light extraction efficiency is reduced due to increased reflection

Engineering Contradiction:
Improvelight output areaVSAvoidlight extraction efficiency
Core Design Contradiction:
Area of stationary objectVSLoss of energy

Solution Approach 1:

The semiconductor laminate is divided into multiple semiconductor regions with different thicknesses. This segmentation shortens the average distance light travels through the laminate, reducing the number of reflections and improving light extraction efficiency while maintaining large overall light output area.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different regions of the semiconductor laminate have different local thickness qualities. The p-type semiconductor layer has varying thicknesses in different regions, creating local quality variations that optimize light extraction in each region while maintaining overall large area performance.

Inventive Principle:
Principle #3Local quality

4Loss of energy

If the thickness of the p-type semiconductor layer is reduced to improve light extraction, then light extraction efficiency is improved, but warpage control becomes more difficult

Engineering Contradiction:
Improvelight extraction efficiencyVSAvoidwarpage control
Core Design Contradiction:
Loss of energyVSStability of the object's composition

Solution Approach 1:

The p-type semiconductor layer is divided into multiple regions with different thicknesses. This segmentation allows each region to have optimized thickness for light extraction while the overall structure maintains warpage control through the combination of different thickness regions.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The p-type semiconductor layer has different local thickness qualities in different regions. This local quality variation enables optimized light extraction in each region while the overall thickness distribution maintains structural stability and warpage control.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach results in a large-sized laminated semiconductor light emitting element with reduced warpage and enhanced light extraction efficiency, increasing the yield of usable semiconductor light emitting elements.

Implementation Method 1

warpage is caused by the difference in a thermal expansion coefficient between the growth substrate and the semiconductor element

Methodology Applied
Scientific EffectThermal expansion coefficient difference: Thermal Expansion

Implementation Method 2

A part of light generated by an active layer of the semiconductor laminate is laterally transmitted, while being reflected by the upper and lower surfaces of the semiconductor laminate

Methodology Applied
Scientific EffectLight reflection: Reflection

Implementation Method 3

When the light is reflected (in particular, reflected off an interface between the substrate and the semiconductor laminate), the light is absorbed

Methodology Applied
Scientific EffectLight absorption: Absorption (EM radiation)

Data Source

PatentUS9093356B2Semiconductor light emitting element
Publication Date: 2015.07.28 NICHIA CORP
  • US9093356B2 patent drawing
  • US9093356B2 patent drawing
  • US9093356B2 patent drawing

AI summary

A semiconductor light emitting element comprises a semiconductor laminate including a p-type semiconductor layer, an active layer and an n-type semiconductor layer which are sequentially laminated; and a conductive support substrate joined to the p-type semiconductor layer side of the semiconductor laminate. The semiconductor laminate is divided into at least two semiconductor regions by a trench penetrating the p-type semiconductor layer, the active layer and the n-type semiconductor layer.