Single Event Latch-Up Protection Circuit With Delayed Power Removal
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Solution Overview
Problem
Existing fault protection solutions fail to detect and protect load devices from single event latch-up (SEL) faults, which occur at load currents within the normal operating range, rendering devices unusable.
Innovation Solution
A single event latch-up detection circuit that includes a first circuitry block to sense instantaneous and average load currents, generating a trigger for SEL detection, and a supervisor module to control a gate voltage and remove power from the load after a preprogrammed delay, using a field effect transistor as a switch to manage power to the load device.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the supervisor module removes power immediately upon detecting SEL_T, then device protection is maximized, but false trips during normal load transients occur
Solution Approach 1:
The supervisor module implements a preliminary delay action after detecting the SEL_T signal before actually removing power from the load. This preliminary delay allows the system to verify whether the current spike is a genuine SEL fault or a normal load transient, thereby preventing false trips while still providing timely protection for actual faults.
Solution Approach 2:
The system employs feedback through the supervisor module that continuously monitors the SEL_T signal and the load current. The feedback mechanism evaluates whether the detected anomaly persists or resolves itself within the delay period, enabling intelligent decision-making about whether to trip the breaker. This feedback loop balances aggressive protection with operational stability.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Effectively detects and mitigates SEL faults by removing power from the load device during a SEL event, preventing permanent damage and ensuring device functionality.
Implementation Method 1
using a field effect transistor as a switch to manage power to the load device
Data Source
AI summary
Embodiments of a single event latch-up (SEL) protection circuit are provided, including: a first circuitry block coupled to a source of an input voltage a load, and digitally controlling a first switch; the first switch generates a load and senses an instantaneous load current iLoad. A second circuitry block is configured to generate an average iLoad and generate single event latch-up triggers (i.e., SEL fault detection) as a function of at least a comparison of the inst_iLoad and average iLoad; wherein this first circuitry block contains the analog based SET filtering needed to reduce false SEL triggers. A supervisor module generates on/off commands for the first switch, responsive to receiving the SEL detection in excess of a preprogrammed delay to provide the final SET filtering to prevent false SEL triggers. The first circuitry block removes the load voltage at N1 upon receiving an off command from the supervisor module.