Mounting Device for SEM Sample Holders in Inverted Microscopes

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Solution Overview

Problem

Existing sample holders for SEM and ion milling instruments pose challenges when used with other microscopy techniques due to protrusions that prevent proper alignment along the optical axis and within the focal plane, leading to difficulties in imaging and data acquisition across multiple analytical techniques.

Innovation Solution

A mounting device comprising a platen, spacer, and leveler that securely positions sample holders with protrusions for use in inverted microscopes, allowing adjustment and alignment within the focal plane, while also accommodating different geometries and reducing ambient light interference.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If SEM sample holders with protrusions are used, then sample integrity is maintained for SEM analysis, but proper alignment along the optical axis and within the focal plane is prevented

Engineering Contradiction:

Improvesample integrityVSAvoidalignment precision

Core Design Contradiction:

ReliabilityVSManufacturing precision

Solution Approach 1:

A mounting device with a flat mounting surface and adjustable positioning mechanism serves as an intermediary between the SEM sample holder and the optical microscope. This mediator accommodates the protrusions on SEM sample holders while providing a flat, adjustable surface that enables proper alignment along the optical axis and within the focal plane, thus resolving the contradiction between maintaining sample integrity and achieving alignment precision

Inventive Principle:

Principle #24Intermediary (Mediator)

Solution Approach 2:

The mounting device incorporates an adjustable positioning mechanism that allows dynamic adjustment of the sample holder's position and orientation. This adjustability enables the system to adapt to different sample holder geometries with protrusions while maintaining precise alignment, thereby resolving the contradiction between sample integrity and alignment precision

Inventive Principle:

Principle #15Dynamics

2Adaptability or versatility

If sample holders are designed for specific SEM/inion milling instruments, then specialized functionality is achieved, but adaptability to other microscopy techniques is reduced

Engineering Contradiction:

Improveinstrument compatibilityVSAvoidmounting structure complexity

Core Design Contradiction:

Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The mounting device is designed with a universal flat mounting surface and adjustable positioning mechanism that can accommodate various sample holder types from different instruments including SEM and ion milling instruments. This universal design enables the same mounting device to work with multiple microscopy techniques, thereby improving instrument compatibility while managing complexity through a standardized interface

Inventive Principle:

Principle #6Universality (Multi-functionality)

Data Source

PatentUS11719923B2Sample holder for using mounted SEM samples in upright and inverted optical microscopes and spectrometers

Publication Date: 2023.08.08 SAUDI ARABIAN OIL CO

AI summary

A mounting device for holding a sample mounted to a sample holder for use in an inverted microscope. The mounting device includes a platen; a mounting located on a sample side of the platen; a sample holder removably coupled to the mounting so the sample is along an optical axis of the inverted microscope; and a spacer shaped as a hollow prism or a hollow cylinder having a height and defining a through hole. The platen is disposed on the spacer with the sample side facing toward the spacer and the sample holder positioned within the through hole. The height of the spacer arranges the sample within a focal plane of the inverted microscope.