Semiconductor Comb-Like Channel Structure for Fin Collapse
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Solution Overview
Problem
Existing semiconductor structures, such as FinFET and MBCFET, face challenges in further miniaturization due to issues like fin collapse, gap filling, etch profile control, and self-heating problems, which limit their performance and area efficiency.
Innovation Solution
A semiconductor apparatus with a comb-like channel structure is proposed, featuring a first portion extending vertically and a second portion extending laterally from the first portion. This structure includes source/drain portions connected to the channel portions and a gate stack overlapping the channel portions, allowing for improved current driving capability and mechanical stability.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Power
If the height of the fin is increased to obtain sufficient drive current, then the current driving capability is improved, but fin collapse and etch profile control problems occur
Solution Approach 1:
The patent transitions from a conventional planar fin structure to a three-dimensional comb-like channel structure with vertical fins and lateral channels. This dimensional change allows the channel to extend in multiple directions (vertical fin height and lateral channel length), providing sufficient drive current through increased channel volume while maintaining structural integrity through the interconnected comb design that distributes mechanical stress.
2Area of stationary object
If the spacing between nanosheets is reduced to improve area efficiency, then the area usage is improved, but self-heating problem becomes severe
Solution Approach 1:
The comb-like channel structure creates a porous three-dimensional network with channels extending vertically and laterally. This porous architecture increases the effective channel area for current conduction while maintaining sufficient spacing between channel segments, allowing heat to dissipate through the open structure and preventing severe self-heating even as device density increases.
3Area of stationary object
If the fin height is increased to save area, then the area efficiency is improved, but gap filling and etch profile control become difficult
Solution Approach 1:
The patent divides the channel structure into segmented comb-like formations with vertical fins and lateral channels rather than a single continuous high fin. This segmentation breaks down the manufacturing challenges into smaller, more manageable sections where etching can be better controlled, while still achieving high area efficiency through the compact three-dimensional arrangement of multiple channel segments.
Data Source
AI summary
Disclosed are a semiconductor apparatus, a manufacturing method therefor, and an electronic equipment comprising the semiconductor apparatus. According to the embodiments, the semiconductor apparatus includes a first device and a second device on a substrate that are opposite each other. The first device and the second device each include a channel portion, source/drain portions on both sides of the channel portion that are connected to the channel portion, and a gate stack overlapping the channel portion. The channel portion includes a first portion extending in a vertical direction relative to the substrate and a second portion extending from the first portion in a transverse direction relative to the substrate. The second portion of the channel portion of the first device and the second portion of the channel portion of the second device extend toward or away from each other.


